Evaluation of serial crystallographic structure determination within megahertz pulse trains
(2019) In Structural Dynamics 6(6). p.064702-064702- Abstract
The new European X-ray Free-Electron Laser (European XFEL) is the first X-ray free-electron laser capable of delivering intense X-ray pulses with a megahertz interpulse spacing in a wavelength range suitable for atomic resolution structure determination. An outstanding but crucial question is whether the use of a pulse repetition rate nearly four orders of magnitude higher than previously possible results in unwanted structural changes due to either radiation damage or systematic effects on data quality. Here, separate structures from the first and subsequent pulses in the European XFEL pulse train were determined, showing that there is essentially no difference between structures determined from different pulses under currently... (More)
The new European X-ray Free-Electron Laser (European XFEL) is the first X-ray free-electron laser capable of delivering intense X-ray pulses with a megahertz interpulse spacing in a wavelength range suitable for atomic resolution structure determination. An outstanding but crucial question is whether the use of a pulse repetition rate nearly four orders of magnitude higher than previously possible results in unwanted structural changes due to either radiation damage or systematic effects on data quality. Here, separate structures from the first and subsequent pulses in the European XFEL pulse train were determined, showing that there is essentially no difference between structures determined from different pulses under currently available operating conditions at the European XFEL.
(Less)
- author
- publishing date
- 2019-11
- type
- Contribution to journal
- publication status
- published
- in
- Structural Dynamics
- volume
- 6
- issue
- 6
- pages
- 064702 - 064702
- publisher
- American Institute of Physics (AIP)
- external identifiers
-
- pmid:31832488
- scopus:85079489777
- ISSN
- 2329-7778
- DOI
- 10.1063/1.5124387
- language
- English
- LU publication?
- no
- additional info
- © 2019 Author(s).
- id
- d55e2622-ed91-4ef3-b133-2e7fd43e98aa
- date added to LUP
- 2019-12-19 11:19:11
- date last changed
- 2024-08-07 11:49:20
@article{d55e2622-ed91-4ef3-b133-2e7fd43e98aa, abstract = {{<p>The new European X-ray Free-Electron Laser (European XFEL) is the first X-ray free-electron laser capable of delivering intense X-ray pulses with a megahertz interpulse spacing in a wavelength range suitable for atomic resolution structure determination. An outstanding but crucial question is whether the use of a pulse repetition rate nearly four orders of magnitude higher than previously possible results in unwanted structural changes due to either radiation damage or systematic effects on data quality. Here, separate structures from the first and subsequent pulses in the European XFEL pulse train were determined, showing that there is essentially no difference between structures determined from different pulses under currently available operating conditions at the European XFEL.</p>}}, author = {{Yefanov, Oleksandr and Oberthür, Dominik and Bean, Richard and Wiedorn, Max O and Knoska, Juraj and Pena, Gisel and Awel, Salah and Gumprecht, Lars and Domaracky, Martin and Sarrou, Iosifina and Lourdu Xavier, P and Metz, Markus and Bajt, Saša and Mariani, Valerio and Gevorkov, Yaroslav and White, Thomas A and Tolstikova, Aleksandra and Villanueva-Perez, Pablo and Seuring, Carolin and Aplin, Steve and Estillore, Armando D and Küpper, Jochen and Klyuev, Alexander and Kuhn, Manuela and Laurus, Torsten and Graafsma, Heinz and Monteiro, Diana C F and Trebbin, Martin and Maia, Filipe R N C and Cruz-Mazo, Francisco and Gañán-Calvo, Alfonso M and Heymann, Michael and Darmanin, Connie and Abbey, Brian and Schmidt, Marius and Fromme, Petra and Giewekemeyer, Klaus and Sikorski, Marcin and Graceffa, Rita and Vagovic, Patrik and Kluyver, Thomas and Bergemann, Martin and Fangohr, Hans and Sztuk-Dambietz, Jolanta and Hauf, Steffen and Raab, Natascha and Bondar, Valerii and Mancuso, Adrian P and Chapman, Henry and Barty, Anton}}, issn = {{2329-7778}}, language = {{eng}}, number = {{6}}, pages = {{064702--064702}}, publisher = {{American Institute of Physics (AIP)}}, series = {{Structural Dynamics}}, title = {{Evaluation of serial crystallographic structure determination within megahertz pulse trains}}, url = {{http://dx.doi.org/10.1063/1.5124387}}, doi = {{10.1063/1.5124387}}, volume = {{6}}, year = {{2019}}, }