Micrometer-resolution imaging using MÖNCH : Towards G2-less grating interferometry
(2016) In Journal of Synchrotron Radiation 23(6). p.1462-1473- Abstract
MÖNCH is a 25 mm-pitch charge-integrating detector aimed at exploring the limits of current hybrid silicon detector technology. The small pixel size makes it ideal for high-resolution imaging. With an electronic noise of about 110 eV r.m.s., it opens new perspectives for many synchrotron applications where currently the detector is the limiting factor, e.g. inelastic X-ray scattering, Laue diffraction and soft X-ray or high-resolution color imaging. Due to the small pixel pitch, the charge cloud generated by absorbed X-rays is shared between neighboring pixels for most of the photons. Therefore, at low photon fluxes, interpolation algorithms can be applied to determine the absorption position of each photon with a resolution of the... (More)
MÖNCH is a 25 mm-pitch charge-integrating detector aimed at exploring the limits of current hybrid silicon detector technology. The small pixel size makes it ideal for high-resolution imaging. With an electronic noise of about 110 eV r.m.s., it opens new perspectives for many synchrotron applications where currently the detector is the limiting factor, e.g. inelastic X-ray scattering, Laue diffraction and soft X-ray or high-resolution color imaging. Due to the small pixel pitch, the charge cloud generated by absorbed X-rays is shared between neighboring pixels for most of the photons. Therefore, at low photon fluxes, interpolation algorithms can be applied to determine the absorption position of each photon with a resolution of the order of 1 μm. In this work, the characterization results of one of the MÖNCH prototypes are presented under low-flux conditions. A custom interpolation algorithm is described and applied to the data to obtain high-resolution images. Images obtained in grating interferometry experiments without the use of the absorption grating G2 are shown and discussed. Perspectives for the future developments of the MÖNCH detector are also presented.
(Less)
- author
- publishing date
- 2016-11-01
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- Grating interferometry, Hybrid detectors, Interpolation, Silicon detectors
- in
- Journal of Synchrotron Radiation
- volume
- 23
- issue
- 6
- pages
- 12 pages
- publisher
- International Union of Crystallography
- external identifiers
-
- scopus:84992653270
- ISSN
- 0909-0495
- DOI
- 10.1107/S1600577516014788
- language
- English
- LU publication?
- no
- additional info
- Publisher Copyright: © 2016 International Union of Crystallography.
- id
- d7c29585-006e-4435-8efc-59647eb4c814
- date added to LUP
- 2023-11-27 09:08:07
- date last changed
- 2024-06-06 18:48:53
@article{d7c29585-006e-4435-8efc-59647eb4c814, abstract = {{<p>MÖNCH is a 25 mm-pitch charge-integrating detector aimed at exploring the limits of current hybrid silicon detector technology. The small pixel size makes it ideal for high-resolution imaging. With an electronic noise of about 110 eV r.m.s., it opens new perspectives for many synchrotron applications where currently the detector is the limiting factor, e.g. inelastic X-ray scattering, Laue diffraction and soft X-ray or high-resolution color imaging. Due to the small pixel pitch, the charge cloud generated by absorbed X-rays is shared between neighboring pixels for most of the photons. Therefore, at low photon fluxes, interpolation algorithms can be applied to determine the absorption position of each photon with a resolution of the order of 1 μm. In this work, the characterization results of one of the MÖNCH prototypes are presented under low-flux conditions. A custom interpolation algorithm is described and applied to the data to obtain high-resolution images. Images obtained in grating interferometry experiments without the use of the absorption grating G<sub>2</sub> are shown and discussed. Perspectives for the future developments of the MÖNCH detector are also presented.</p>}}, author = {{Cartier, Sebastian and Kagias, Matias and Bergamaschi, Anna and Wang, Zhentian and Dinapoli, Roberto and Mozzanica, Aldo and Ramilli, Marco and Schmitt, Bernd and Brückner, Martin and Fröjdh, Erik and Greiffenberg, Dominic and Mayilyan, Davit and Mezza, Davide and Redford, Sophie and Ruder, Christian and Schädler, Lukas and Shi, Xintian and Thattil, Dhanya and Tinti, Gemma and Zhang, Jiaguo and Stampanoni, Marco}}, issn = {{0909-0495}}, keywords = {{Grating interferometry; Hybrid detectors; Interpolation; Silicon detectors}}, language = {{eng}}, month = {{11}}, number = {{6}}, pages = {{1462--1473}}, publisher = {{International Union of Crystallography}}, series = {{Journal of Synchrotron Radiation}}, title = {{Micrometer-resolution imaging using MÖNCH : Towards G<sub>2</sub>-less grating interferometry}}, url = {{http://dx.doi.org/10.1107/S1600577516014788}}, doi = {{10.1107/S1600577516014788}}, volume = {{23}}, year = {{2016}}, }