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Studies of electron diffusion in photo-excited Ni using time-resolved X-ray diffraction

Persson, A. I H LU ; Jarnac, A. LU ; Wang, Xiaocui LU ; Enquist, H. LU ; Jurgilaitis, A. LU and Larsson, Jörgen LU (2016) In Applied Physics Letters 109(20).
Abstract

We show that the heat deposition profile in a laser-excited metal can be determined by time-resolved X-ray diffraction. In this study, we investigated the electron diffusion in a 150 nm thick nickel film deposited on an indium antimonide substrate. A strain wave that mimics the heat deposition profile is generated in the metal and propagates into the InSb, where it influences the temporal profile of X-rays diffracted from InSb. We found that the strain pulse significantly deviated from a simple exponential profile, and that the two-temperature model was needed to reproduce the measured heat deposition profile. Experimental results were compared to simulations based on the two-temperature model carried out using commercial finite-element... (More)

We show that the heat deposition profile in a laser-excited metal can be determined by time-resolved X-ray diffraction. In this study, we investigated the electron diffusion in a 150 nm thick nickel film deposited on an indium antimonide substrate. A strain wave that mimics the heat deposition profile is generated in the metal and propagates into the InSb, where it influences the temporal profile of X-rays diffracted from InSb. We found that the strain pulse significantly deviated from a simple exponential profile, and that the two-temperature model was needed to reproduce the measured heat deposition profile. Experimental results were compared to simulations based on the two-temperature model carried out using commercial finite-element software packages and on-line dynamical diffraction tools. To reproduce the experimental data, the electron-phonon coupling factor was lowered compared to previously measured values. The experiment was carried out at a third-generation synchrotron radiation source using a high-brightness beam and an ultrafast X-ray streak camera with a temporal resolution of 3 ps.

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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Applied Physics Letters
volume
109
issue
20
publisher
American Institute of Physics
external identifiers
  • scopus:84998979377
  • wos:000388000000056
ISSN
0003-6951
DOI
10.1063/1.4967470
language
English
LU publication?
yes
id
dc3e308b-dcbd-4604-a6a5-f3100b2abee1
date added to LUP
2016-12-19 13:10:28
date last changed
2017-10-27 13:32:12
@article{dc3e308b-dcbd-4604-a6a5-f3100b2abee1,
  abstract     = {<p>We show that the heat deposition profile in a laser-excited metal can be determined by time-resolved X-ray diffraction. In this study, we investigated the electron diffusion in a 150 nm thick nickel film deposited on an indium antimonide substrate. A strain wave that mimics the heat deposition profile is generated in the metal and propagates into the InSb, where it influences the temporal profile of X-rays diffracted from InSb. We found that the strain pulse significantly deviated from a simple exponential profile, and that the two-temperature model was needed to reproduce the measured heat deposition profile. Experimental results were compared to simulations based on the two-temperature model carried out using commercial finite-element software packages and on-line dynamical diffraction tools. To reproduce the experimental data, the electron-phonon coupling factor was lowered compared to previously measured values. The experiment was carried out at a third-generation synchrotron radiation source using a high-brightness beam and an ultrafast X-ray streak camera with a temporal resolution of 3 ps.</p>},
  articleno    = {203115},
  author       = {Persson, A. I H and Jarnac, A. and Wang, Xiaocui and Enquist, H. and Jurgilaitis, A. and Larsson, Jörgen},
  issn         = {0003-6951},
  language     = {eng},
  month        = {11},
  number       = {20},
  publisher    = {American Institute of Physics},
  series       = {Applied Physics Letters},
  title        = {Studies of electron diffusion in photo-excited Ni using time-resolved X-ray diffraction},
  url          = {http://dx.doi.org/10.1063/1.4967470},
  volume       = {109},
  year         = {2016},
}