IEEE Std. P1687.1 for Access Control of Reconfigurable Scan Networks
Larsson, Erik LU
; Xiang, Zehang
and Murali, Prathamesh
(2020)
25th IEEE European Test Symposium (ETS), 2020
- Abstract
- We address access control of reconfigurable scan networks, like IEEE Std. 1687 networks. We propose an on- chip test block to perform: (1) test for faulty scan-chains, (2) localization of faulty scan-chains and (3) repair by excluding faulty scan-chains, and an access control block to (1) control so scan- chains (instruments) are only accessed in allowed combinations, (2) detection of access attempts to instrument in not allowed combinations, and (3) monitoring how theses attempts are made. The key features are two-fold. First, in respect to operation and maintenance. If the physical implementation of an IEEE Std. 1687 network changes due to faults, the instrument connectivity language (ICL) and procedural description language (PDL) need... (More)
- We address access control of reconfigurable scan networks, like IEEE Std. 1687 networks. We propose an on- chip test block to perform: (1) test for faulty scan-chains, (2) localization of faulty scan-chains and (3) repair by excluding faulty scan-chains, and an access control block to (1) control so scan- chains (instruments) are only accessed in allowed combinations, (2) detection of access attempts to instrument in not allowed combinations, and (3) monitoring how theses attempts are made. The key features are two-fold. First, in respect to operation and maintenance. If the physical implementation of an IEEE Std. 1687 network changes due to faults, the instrument connectivity language (ICL) and procedural description language (PDL) need to be updated. To avoid keeping track and updating ICL and PDL for each individual integrated circuit (IC), proposed test block, placed at each IC, makes adjustments of PDL according to the faults of the particular IC. Second, a centralized access control block with key information about the network to detect and handle un- authorized access. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/e7db0e4e-1baf-4c87-9539-6ec943b2433f
- author
- Larsson, Erik
LU
; Xiang, Zehang
and Murali, Prathamesh
- organization
- publishing date
- 2020
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- 2020 IEEE European Test Symposium (ETS)
- pages
- 2 pages
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- 25th IEEE European Test Symposium (ETS), 2020
- conference location
- Tallinn, Estonia
- conference dates
- 2020-05-25 - 2020-05-29
- external identifiers
-
- scopus:85089156512
- ISBN
- 978-1-7281-4312-5
- DOI
- 10.1109/ETS48528.2020.9131555
- language
- English
- LU publication?
- yes
- id
- e7db0e4e-1baf-4c87-9539-6ec943b2433f
- date added to LUP
- 2020-04-01 18:38:27
- date last changed
- 2022-04-18 21:40:28
@inproceedings{e7db0e4e-1baf-4c87-9539-6ec943b2433f,
abstract = {{We address access control of reconfigurable scan networks, like IEEE Std. 1687 networks. We propose an on- chip test block to perform: (1) test for faulty scan-chains, (2) localization of faulty scan-chains and (3) repair by excluding faulty scan-chains, and an access control block to (1) control so scan- chains (instruments) are only accessed in allowed combinations, (2) detection of access attempts to instrument in not allowed combinations, and (3) monitoring how theses attempts are made. The key features are two-fold. First, in respect to operation and maintenance. If the physical implementation of an IEEE Std. 1687 network changes due to faults, the instrument connectivity language (ICL) and procedural description language (PDL) need to be updated. To avoid keeping track and updating ICL and PDL for each individual integrated circuit (IC), proposed test block, placed at each IC, makes adjustments of PDL according to the faults of the particular IC. Second, a centralized access control block with key information about the network to detect and handle un- authorized access.}},
author = {{Larsson, Erik and Xiang, Zehang and Murali, Prathamesh}},
booktitle = {{2020 IEEE European Test Symposium (ETS)}},
isbn = {{978-1-7281-4312-5}},
language = {{eng}},
publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
title = {{IEEE Std. P1687.1 for Access Control of Reconfigurable Scan Networks}},
url = {{https://lup.lub.lu.se/search/files/79436291/main.pdf}},
doi = {{10.1109/ETS48528.2020.9131555}},
year = {{2020}},
}