Advanced

Test of Reconfigurable Modules in Scan Networks

Cantoro, Riccardo; Ghani Zadegan, Farrokh LU ; Palena, Marco; Pasini, Paolo; Larsson, Erik LU and Sonza Reorda, Matteo (2018) In IEEE Transactions on Computers 67(12). p.1806-1817
Abstract

Modern devices often include several embedded instruments, such as BIST interfaces, sensors, calibration facilities. New standards, such as IEEE Std 1687, provide vehicles to access these instruments. In approaches based on reconfigurable scan networks (RSNs), instruments are coupled with scan registers, connected into chains and interleaved with reconfigurable modules. Such modules embed reconfigurable multiplexers that permit a selective access to different parts of the chain. A similar scenario is also supported by IEEE Std 1149.1-2013. The test of permanent faults affecting an RSN requires to shift test vectors throughout a certain number of network configurations. This paper presents some methodologies to select the list of... (More)

Modern devices often include several embedded instruments, such as BIST interfaces, sensors, calibration facilities. New standards, such as IEEE Std 1687, provide vehicles to access these instruments. In approaches based on reconfigurable scan networks (RSNs), instruments are coupled with scan registers, connected into chains and interleaved with reconfigurable modules. Such modules embed reconfigurable multiplexers that permit a selective access to different parts of the chain. A similar scenario is also supported by IEEE Std 1149.1-2013. The test of permanent faults affecting an RSN requires to shift test vectors throughout a certain number of network configurations. This paper presents some methodologies to select the list of configurations that perform the complete test of the reconfigurable modules of the RSN. In particular, one method is presented that, by construction, can be proved to be able to apply the test in the minimum amount of clock cycles. Other methods are sub-optimal in terms of test application time (TAT), but scale well on large circuits. In order to provide a comparison between the proposed methods, experimental results on some benchmark RSNs are provided.

(Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
A* Algorithm, Built-in self-test, Circuit faults, IEEE Standards, IEEE Std 1687, Instruments, Multiplexing, Reconfigurable Scan Networks, Test
in
IEEE Transactions on Computers
volume
67
issue
12
pages
1806 - 1817
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
external identifiers
  • scopus:85046734722
ISSN
0018-9340
DOI
10.1109/TC.2018.2834915
language
English
LU publication?
yes
id
ee1dc767-1ae1-462d-9e65-bbec2c066429
date added to LUP
2018-05-23 14:18:14
date last changed
2019-03-17 05:06:17
@article{ee1dc767-1ae1-462d-9e65-bbec2c066429,
  abstract     = {<p>Modern devices often include several embedded instruments, such as BIST interfaces, sensors, calibration facilities. New standards, such as IEEE Std 1687, provide vehicles to access these instruments. In approaches based on reconfigurable scan networks (RSNs), instruments are coupled with scan registers, connected into chains and interleaved with reconfigurable modules. Such modules embed reconfigurable multiplexers that permit a selective access to different parts of the chain. A similar scenario is also supported by IEEE Std 1149.1-2013. The test of permanent faults affecting an RSN requires to shift test vectors throughout a certain number of network configurations. This paper presents some methodologies to select the list of configurations that perform the complete test of the reconfigurable modules of the RSN. In particular, one method is presented that, by construction, can be proved to be able to apply the test in the minimum amount of clock cycles. Other methods are sub-optimal in terms of test application time (TAT), but scale well on large circuits. In order to provide a comparison between the proposed methods, experimental results on some benchmark RSNs are provided.</p>},
  author       = {Cantoro, Riccardo and Ghani Zadegan, Farrokh and Palena, Marco and Pasini, Paolo and Larsson, Erik and Sonza Reorda, Matteo},
  issn         = {0018-9340},
  keyword      = {A* Algorithm,Built-in self-test,Circuit faults,IEEE Standards,IEEE Std 1687,Instruments,Multiplexing,Reconfigurable Scan Networks,Test},
  language     = {eng},
  month        = {05},
  number       = {12},
  pages        = {1806--1817},
  publisher    = {IEEE--Institute of Electrical and Electronics Engineers Inc.},
  series       = {IEEE Transactions on Computers},
  title        = {Test of Reconfigurable Modules in Scan Networks},
  url          = {http://dx.doi.org/10.1109/TC.2018.2834915},
  volume       = {67},
  year         = {2018},
}