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Field effect studies on rubrene and impurities of rubrene

Zeis, R ; Besnard, Céline LU ; Siegrist, Theo LU ; Schlockermann, C ; Chi, XL and Kloc, C (2006) In Chemistry of Materials 18(2). p.244-248
Abstract
Rubrene single crystals have been grown by a vapor-phase process. Two additional compounds that contaminate rubrene have been identified and their structures determined. Single crystals of rubrene show excellent crystallinity and very small rocking curve width. Field effect transistors based on pure rubrene single crystals with colloidal graphite electrodes and Parylene as a dielectric demonstrate a maximal mobility of 13 cm(2)/Vs with strong anisotropy. The mobility increases very slightly with cooling, but decreases significantly at low temperatures.
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author
; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Chemistry of Materials
volume
18
issue
2
pages
244 - 248
publisher
The American Chemical Society (ACS)
external identifiers
  • wos:000234967900004
  • scopus:33644556479
ISSN
0897-4756
DOI
10.1021/cm0502626
language
English
LU publication?
yes
additional info
The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Polymer and Materials Chemistry (LTH) (011001041)
id
f0fd2bcf-a004-4af6-a7d2-7275672b6bcd (old id 419509)
date added to LUP
2016-04-01 11:49:39
date last changed
2022-04-28 20:39:17
@article{f0fd2bcf-a004-4af6-a7d2-7275672b6bcd,
  abstract     = {{Rubrene single crystals have been grown by a vapor-phase process. Two additional compounds that contaminate rubrene have been identified and their structures determined. Single crystals of rubrene show excellent crystallinity and very small rocking curve width. Field effect transistors based on pure rubrene single crystals with colloidal graphite electrodes and Parylene as a dielectric demonstrate a maximal mobility of 13 cm(2)/Vs with strong anisotropy. The mobility increases very slightly with cooling, but decreases significantly at low temperatures.}},
  author       = {{Zeis, R and Besnard, Céline and Siegrist, Theo and Schlockermann, C and Chi, XL and Kloc, C}},
  issn         = {{0897-4756}},
  language     = {{eng}},
  number       = {{2}},
  pages        = {{244--248}},
  publisher    = {{The American Chemical Society (ACS)}},
  series       = {{Chemistry of Materials}},
  title        = {{Field effect studies on rubrene and impurities of rubrene}},
  url          = {{http://dx.doi.org/10.1021/cm0502626}},
  doi          = {{10.1021/cm0502626}},
  volume       = {{18}},
  year         = {{2006}},
}