Advanced

Gaia on-board metrology: basic angle and best focus

Mora, A.; Biermann, M.; Brown, A. G. A.; Busonero, D.; Carminati, L.; Carrasco, J. M.; Chassat, F.; Erdmann, M.; Gielesen, W. L. M. and Jordi, C., et al. (2014) Conference on Space Telescopes and Instrumentation - Optical, Infrared, and Millimeter Wave 9143. p.91430-91430
Abstract
The Gala payload ensures maximum passive stability using a single material, SiC, for most of its elements. Dedicated metrology instruments are, however, required to carry out two functions: monitoring the basic angle and refocusing the telescope. Two interferometers fed by the same laser are used to measure the basic angle changes at the level of pas (prad, micropixel), which is the highest level ever achieved in space. Two ShackHartmann wavefront sensors, combined with an ad-hoc analysis of the scientific data are used to define and reach the overall best-focus. In this contribution, the systems, data analysis, procedures and performance achieved during commissioning are presented
Please use this url to cite or link to this publication:
author
, et al. (More)
(Less)
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
Astrometry, Gaia, metrology, interferometry, basic angle monitor, wavefront sensor, Shack-Hartmann, wavefront reconstruction, centroid, Cramer-Rao, spectral resolution
host publication
Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave
volume
9143
pages
91430 - 91430
publisher
SPIE
conference name
Conference on Space Telescopes and Instrumentation - Optical, Infrared, and Millimeter Wave
conference location
Montreal, Canada
conference dates
2014-06-22 - 2014-06-27
external identifiers
  • wos:000354526800027
  • scopus:84927649068
ISSN
0277-786X
1996-756X
DOI
10.1117/12.2054602
language
English
LU publication?
yes
id
f386bbd9-b2dd-4280-863a-01055a9bfdcf (old id 7411339)
date added to LUP
2015-06-29 09:14:10
date last changed
2019-02-27 01:16:59
@inproceedings{f386bbd9-b2dd-4280-863a-01055a9bfdcf,
  abstract     = {The Gala payload ensures maximum passive stability using a single material, SiC, for most of its elements. Dedicated metrology instruments are, however, required to carry out two functions: monitoring the basic angle and refocusing the telescope. Two interferometers fed by the same laser are used to measure the basic angle changes at the level of pas (prad, micropixel), which is the highest level ever achieved in space. Two ShackHartmann wavefront sensors, combined with an ad-hoc analysis of the scientific data are used to define and reach the overall best-focus. In this contribution, the systems, data analysis, procedures and performance achieved during commissioning are presented},
  author       = {Mora, A. and Biermann, M. and Brown, A. G. A. and Busonero, D. and Carminati, L. and Carrasco, J. M. and Chassat, F. and Erdmann, M. and Gielesen, W. L. M. and Jordi, C. and Katz, D. and Kohley, R. and Lindegren, Lennart and Loeffler, W. and Marchal, O. and Panuzzo, P. and Seabroke, G. and Sahlmann, J. and Serpell, E. and Serraller, I. and van Leeuwen, F. and van Reeven, W. and van den Dool, T. C. and Vosteen, L. L. A.},
  issn         = {0277-786X},
  keyword      = {Astrometry,Gaia,metrology,interferometry,basic angle monitor,wavefront sensor,Shack-Hartmann,wavefront reconstruction,centroid,Cramer-Rao,spectral resolution},
  language     = {eng},
  location     = {Montreal, Canada},
  pages        = {91430--91430},
  publisher    = {SPIE},
  title        = {Gaia on-board metrology: basic angle and best focus},
  url          = {http://dx.doi.org/10.1117/12.2054602},
  volume       = {9143},
  year         = {2014},
}