Signal-to-noise criterion for free-propagation imaging techniques at free-electron lasers and synchrotrons
(2016) In Optics Express 24(4). p.3189-3201- Abstract
We propose a signal-to-noise criterion which predicts whether a feature of a given size and scattering strength, placed inside a larger object, can be retrieved with two common X-ray imaging techniques: coherent diffraction imaging and projection microscopy. This criterion, based on how efficiently these techniques detect the scattered photons and validated through simulations, shows in general that projection microscopy can resolve smaller phase differences and features than coherent diffraction imaging. Our criterion can be used to design optimized imaging experiments and perform feasibility studies for sensitive biological materials in free-electron lasers, where the number of photons per pulse is limited, or in synchrotron... (More)
We propose a signal-to-noise criterion which predicts whether a feature of a given size and scattering strength, placed inside a larger object, can be retrieved with two common X-ray imaging techniques: coherent diffraction imaging and projection microscopy. This criterion, based on how efficiently these techniques detect the scattered photons and validated through simulations, shows in general that projection microscopy can resolve smaller phase differences and features than coherent diffraction imaging. Our criterion can be used to design optimized imaging experiments and perform feasibility studies for sensitive biological materials in free-electron lasers, where the number of photons per pulse is limited, or in synchrotron experiments, for both techniques.
(Less)
- author
- Villanueva-Perez, Pablo
LU
; Pedrini, Bill ; Mokso, Rajmund LU ; Guizar-Sicairos, Manuel ; Arcadu, Filippo and Stampanoni, Marco
- organization
- publishing date
- 2016-02-22
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Optics Express
- volume
- 24
- issue
- 4
- pages
- 13 pages
- publisher
- Optical Society of America
- external identifiers
-
- wos:000371433700006
- scopus:84961728304
- ISSN
- 1094-4087
- DOI
- 10.1364/OE.24.003189
- language
- English
- LU publication?
- yes
- id
- f47f1414-3384-453d-b8ea-12d92352d407
- date added to LUP
- 2016-07-14 13:22:55
- date last changed
- 2024-07-12 13:39:13
@article{f47f1414-3384-453d-b8ea-12d92352d407, abstract = {{<p>We propose a signal-to-noise criterion which predicts whether a feature of a given size and scattering strength, placed inside a larger object, can be retrieved with two common X-ray imaging techniques: coherent diffraction imaging and projection microscopy. This criterion, based on how efficiently these techniques detect the scattered photons and validated through simulations, shows in general that projection microscopy can resolve smaller phase differences and features than coherent diffraction imaging. Our criterion can be used to design optimized imaging experiments and perform feasibility studies for sensitive biological materials in free-electron lasers, where the number of photons per pulse is limited, or in synchrotron experiments, for both techniques.</p>}}, author = {{Villanueva-Perez, Pablo and Pedrini, Bill and Mokso, Rajmund and Guizar-Sicairos, Manuel and Arcadu, Filippo and Stampanoni, Marco}}, issn = {{1094-4087}}, language = {{eng}}, month = {{02}}, number = {{4}}, pages = {{3189--3201}}, publisher = {{Optical Society of America}}, series = {{Optics Express}}, title = {{Signal-to-noise criterion for free-propagation imaging techniques at free-electron lasers and synchrotrons}}, url = {{http://dx.doi.org/10.1364/OE.24.003189}}, doi = {{10.1364/OE.24.003189}}, volume = {{24}}, year = {{2016}}, }