Ultrasensitive mass sensor fully integrated with complementary metal-oxide-semiconductor circuitry
(2005) In Applied Physics Letters 87(4).- Abstract
- Nanomechanical resonators have been monolithically integrated on preprocessed complementary metal-oxide-semiconductor (CMOS) chips. Fabricated resonator systems have been designed to have resonance frequencies up to 1.5 MHz. The systems have been characterized in ambient air and vacuum conditions and display ultrasensitive mass detection in air. A mass sensitivity of 4 ag/Hz has been determined in air by placing a single glycerine drop, having a measured weight of 57 fg, at the apex of a cantilever and subsequently measuring a frequency shift of 14.8 kHz. CMOS integration enables electrostatic excitation, capacitive detection, and amplification of the resonance signal directly on the chip.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/232196
- author
- organization
- publishing date
- 2005
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Applied Physics Letters
- volume
- 87
- issue
- 4
- article number
- 043507
- publisher
- American Institute of Physics (AIP)
- external identifiers
-
- wos:000230725900069
- scopus:23744456430
- ISSN
- 0003-6951
- DOI
- 10.1063/1.1999838
- language
- English
- LU publication?
- yes
- id
- f93583b9-6969-4745-af28-80f1630e14dc (old id 232196)
- date added to LUP
- 2016-04-01 12:11:19
- date last changed
- 2022-01-27 00:04:11
@article{f93583b9-6969-4745-af28-80f1630e14dc, abstract = {{Nanomechanical resonators have been monolithically integrated on preprocessed complementary metal-oxide-semiconductor (CMOS) chips. Fabricated resonator systems have been designed to have resonance frequencies up to 1.5 MHz. The systems have been characterized in ambient air and vacuum conditions and display ultrasensitive mass detection in air. A mass sensitivity of 4 ag/Hz has been determined in air by placing a single glycerine drop, having a measured weight of 57 fg, at the apex of a cantilever and subsequently measuring a frequency shift of 14.8 kHz. CMOS integration enables electrostatic excitation, capacitive detection, and amplification of the resonance signal directly on the chip.}}, author = {{Forsen, E and Abadal, G and Ghatnekar-Nilsson, Sara and Teva, J and Verd, J and Sandberg, R and Svendsen, W and Perez-Murano, F and Esteve, J and Figueras, E and Campabadal, F and Montelius, Lars and Barniol, N and Boisen, A}}, issn = {{0003-6951}}, language = {{eng}}, number = {{4}}, publisher = {{American Institute of Physics (AIP)}}, series = {{Applied Physics Letters}}, title = {{Ultrasensitive mass sensor fully integrated with complementary metal-oxide-semiconductor circuitry}}, url = {{http://dx.doi.org/10.1063/1.1999838}}, doi = {{10.1063/1.1999838}}, volume = {{87}}, year = {{2005}}, }