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One detector, all the light elements – Low-background NRA, RBS and ERDA for the quantification of elements from hydrogen to fluorine

Frost, R. J.W. LU ; De La Rosa, N. LU ; Elfman, M. LU ; Kristiansson, P. LU ; Nilsson, E. J.C. LU ; Pallon, J. LU and Ros, L. LU (2021) In Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 494-495. p.34-45
Abstract

Presented is a review of the accomplishments, of the light-element program, conducted at the Lund Ion-Beam Analysis Facility. A detailed account is given of the current experimental setup at the total Ion-Beam Analysis Chamber, which is equipped with two Double-Sided Silicon Strip Detectors for charge particle detection, a silicon drift detector for PIXE analysis, an electrostatic deflection system for charge measurement and implements a Nuclear Micro-Probe. A summary of the work conducted to date on the quantification of low Z elements is presented on a case by case basis. Details of the current work efforts and an overview of the advances which are intended in the near future are given.

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author
; ; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
Double sided silicon strip detector, Ion-beam analysis, Light element analysis, Nuclear micro-probe, Quantitative analysis
in
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
volume
494-495
pages
12 pages
publisher
Elsevier
external identifiers
  • scopus:85102635808
ISSN
0168-583X
DOI
10.1016/j.nimb.2021.02.009
language
English
LU publication?
yes
id
fbfcc4cf-8d1a-4b2f-9450-139597eb6b65
date added to LUP
2021-03-24 07:41:40
date last changed
2023-11-21 01:28:39
@article{fbfcc4cf-8d1a-4b2f-9450-139597eb6b65,
  abstract     = {{<p>Presented is a review of the accomplishments, of the light-element program, conducted at the Lund Ion-Beam Analysis Facility. A detailed account is given of the current experimental setup at the total Ion-Beam Analysis Chamber, which is equipped with two Double-Sided Silicon Strip Detectors for charge particle detection, a silicon drift detector for PIXE analysis, an electrostatic deflection system for charge measurement and implements a Nuclear Micro-Probe. A summary of the work conducted to date on the quantification of low Z elements is presented on a case by case basis. Details of the current work efforts and an overview of the advances which are intended in the near future are given.</p>}},
  author       = {{Frost, R. J.W. and De La Rosa, N. and Elfman, M. and Kristiansson, P. and Nilsson, E. J.C. and Pallon, J. and Ros, L.}},
  issn         = {{0168-583X}},
  keywords     = {{Double sided silicon strip detector; Ion-beam analysis; Light element analysis; Nuclear micro-probe; Quantitative analysis}},
  language     = {{eng}},
  pages        = {{34--45}},
  publisher    = {{Elsevier}},
  series       = {{Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms}},
  title        = {{One detector, all the light elements – Low-background NRA, RBS and ERDA for the quantification of elements from hydrogen to fluorine}},
  url          = {{http://dx.doi.org/10.1016/j.nimb.2021.02.009}},
  doi          = {{10.1016/j.nimb.2021.02.009}},
  volume       = {{494-495}},
  year         = {{2021}},
}