Combined Test Data Compression and Abort-on-Fail Test
Larsson, Erik LU
(2006)
NORCHIP Conference, 2006
p.137-140
- Abstract
- The increasing test data volume needed for the testing of System-on-Chips (SOCs) leads to high Automatic Test Equipment (ATE) memory requirement and long test application times. Scheduling techniques where testing can be terminated as soon as a fault appears (abort-on-fail) as well as efficient compression schemes to reduce the ATE memory requirement have been proposed separately. Previous test data compression architectures often make use of Multiple Input Signature Response Analyzers (MISRs) for response compression. Therefore, abort-on-fail testing and diagnostic capabilities are limited. In this paper, we propose an SOC test architecture that (1) allows test data compression, (2) where clock cycle based as well as patternbased... (More)
- The increasing test data volume needed for the testing of System-on-Chips (SOCs) leads to high Automatic Test Equipment (ATE) memory requirement and long test application times. Scheduling techniques where testing can be terminated as soon as a fault appears (abort-on-fail) as well as efficient compression schemes to reduce the ATE memory requirement have been proposed separately. Previous test data compression architectures often make use of Multiple Input Signature Response Analyzers (MISRs) for response compression. Therefore, abort-on-fail testing and diagnostic capabilities are limited. In this paper, we propose an SOC test architecture that (1) allows test data compression, (2) where clock cycle based as well as patternbased abort-on-fail testing are allowed and (3) diagnostic capabilities are not reduced. We have performed experiments on ISCAS designs. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2341031
- author
- Larsson, Erik
LU
- publishing date
- 2006
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- testing, test data, compression, abort-on-fail
- host publication
- [Host publication title missing]
- pages
- 137 - 140
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- NORCHIP Conference, 2006
- conference location
- Linköping, Sweden
- conference dates
- 2006-11-20 - 2006-11-21
- external identifiers
-
- scopus:34547254766
- ISBN
- 1-4244-0772-9
- DOI
- 10.1109/NORCHP.2006.329262
- language
- English
- LU publication?
- no
- id
- fd6286a9-d4f3-4b0c-a083-1bb4d28f879f (old id 2341031)
- date added to LUP
- 2016-04-04 12:19:12
- date last changed
- 2022-01-29 23:14:14
@inproceedings{fd6286a9-d4f3-4b0c-a083-1bb4d28f879f,
abstract = {{The increasing test data volume needed for the testing of System-on-Chips (SOCs) leads to high Automatic Test Equipment (ATE) memory requirement and long test application times. Scheduling techniques where testing can be terminated as soon as a fault appears (abort-on-fail) as well as efficient compression schemes to reduce the ATE memory requirement have been proposed separately. Previous test data compression architectures often make use of Multiple Input Signature Response Analyzers (MISRs) for response compression. Therefore, abort-on-fail testing and diagnostic capabilities are limited. In this paper, we propose an SOC test architecture that (1) allows test data compression, (2) where clock cycle based as well as patternbased abort-on-fail testing are allowed and (3) diagnostic capabilities are not reduced. We have performed experiments on ISCAS designs.}},
author = {{Larsson, Erik}},
booktitle = {{[Host publication title missing]}},
isbn = {{1-4244-0772-9}},
keywords = {{testing; test data; compression; abort-on-fail}},
language = {{eng}},
pages = {{137--140}},
publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
title = {{Combined Test Data Compression and Abort-on-Fail Test}},
url = {{http://dx.doi.org/10.1109/NORCHP.2006.329262}},
doi = {{10.1109/NORCHP.2006.329262}},
year = {{2006}},
}