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- 2008
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Mark
200 and 300 MeV/nucleon nuclear reactions responsible for single-event effects in microelectronics
(
- Contribution to journal › Article
- 2007
-
Mark
A detector system for studying nuclear reactions relevant to Single Event Effects
2007) In Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment 578(2). p.385-398(
- Contribution to journal › Article