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- 2011
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Mark
Scheduling Tests for 3D Stacked Chips under Power Constraints
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
A Study of Instrument Reuse and Retargeting in P1687
2011) IEEE Twelfth Workshop on RTL and High Level Testing (WRTLT 2011)(
- Contribution to conference › Paper, not in proceeding
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Mark
Test Scheduling and Test Access Optimization for Core-Based 3D Stacked ICs with Through-Silicon Vias: poster
2011) IEEE European Test Symposium (ETS), 2011(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2010
-
Mark
On-line Techniques to Adjust and Optimize Checkpointing Frequency
2010) IEEE International Workshop on Realiability Aware System Design and Test (RASDAT 2010) p.29-33(
- Contribution to conference › Paper, not in proceeding
-
Mark
Test Scheduling of Modular System-on-Chip under Capture Power Constraint
2010) IEEE Eleventh Workshop on RTL and High Level Testing, 2010(
- Contribution to conference › Paper, not in proceeding
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Mark
Checking Pipelined Distributed and Global Properties at Post-silicon Debug
2010) DAC Workshop on Diagnostic Services in Network-on-Chips (DSNoC'10)(
- Contribution to conference › Paper, not in proceeding
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Mark
Efficient Embedding of Deterministic Test Data
2010) 19th IEEE Asian Test Symposium (ATS10)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Energy-Efficient Fault Tolerance in Chip Multiprocessors Using Critical Value Forwarding
2010) The 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'10)Chicago, Illinois, USA, June 28-July 1, 2010. p.121-130(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Multiplexed redundant execution: A technique for efficient fault tolerance in chip multiprocessors
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules
2010) IEEE East-West Design and Test Symposium (EWDTS10)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding