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2005
Mark Direct observation of the atomic scale structure inside a nanowire
Mikkelsen, Anders ^LU ; Sköld, Niklas ^LU ; Ouattara, Lassana ^LU ; Borgström, Magnus ^LU ; Andersen, Jesper N ^LU ; Samuelson, Lars ^LU ; Seifert, Werner ^LU and Lundgren, Edvin ^LU (2005) 32nd Conf on the Physics and Chemistry of Semicond Interfaces, Bozeman, Mo, USA (2005)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2004
Mark Direct imaging of the atomic structure inside a nanowire by scanning tunnelling microscopy
Mikkelsen, Anders ^LU ; Sköld, Niklas ^LU ; Ouattara, Lassana ^LU ; Borgström, Magnus ^LU ; Andersen, Jesper N ^LU ; Samuelson, Lars ^LU ; Seifert, Werner ^LU and Lundgren, Edvin ^LU (2004) In Nature Materials 3(8). p.519-523
- Contribution to journal › Article
Mark A cross-sectional STM study of nanowhiskers
Lundgren, Edvin ^LU ; Ouattara, Lassana ^LU ; Mikkelsen, Anders ^LU ; Andersen, Jesper N ^LU ; Seifert, Werner ^LU and Samuelson, Lars ^LU (2004) March Meet of the American Physical Society, 2004
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Direct atomically resolved imaging inside a nanowire
Mikkelsen, Anders ^LU ; Sköld, Niklas ^LU ; Ouattara, Lassana ^LU ; Borgström, Magnus ^LU ; Andersen, Jesper N ^LU ; Samuelson, Lars ^LU ; Seifert, Werner ^LU and Lundgren, Edvin ^LU (2004) 51st Int Symp American Vacuum Soc, Anaheim, Ca, USA (2004)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Direct atomically resolved imaging inside a nanowire
Mikkelsen, Anders ^LU ; Sköld, Niklas ^LU ; Ouattara, Lassana ^LU ; Andersen, Jesper N ^LU ; Samuelson, Lars ^LU ; Seifert, Werner ^LU and Lundgren, Edvin ^LU (2004) 8th International Conference on Nanometer-Scale Science and Technology, 2004
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Direct atomically resolved imaging inside a nanowire
Mikkelsen, Anders ^LU ; Sköld, Niklas ^LU ; Ouattara, Lassana ^LU ; Borgström, Magnus ^LU ; Andersen, Jesper N ^LU ; Samuelson, Lars ^LU ; Seifert, Werner ^LU and Lundgren, Edvin ^LU (2004) Intl Conf on Scanning Probe Microscopy, Sensors and Nanostruct, Beijing, China (2004)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding