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- 2005
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Mark
Influence of the spacer layer distance in stacked InAs/InP quantum dots, studied by cross-sectional scanning tunneling microscopy
2005) 13th Intl Congr on Thin Films and 8th Intl Conf on Atomically Controlled Surf, Interfaces and Nanostr, Stockholm, Sweden (2005)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Direct observation of the atomic scale structure inside a nanowire
2005) 32nd Conf on the Physics and Chemistry of Semicond Interfaces, Bozeman, Mo, USA (2005)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Investigating InAs nanowires on InAs(111) using scanning tunneling microscopy
2005) 13th Intl Congr on Thin Films and 8th Intl Conf on Atomically Controlled Surf, Interfaces and Nanostr, Stockholm, Sweden (2005)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2004
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Mark
Direct imaging of the atomic structure inside a nanowire by scanning tunnelling microscopy
(
- Contribution to journal › Article
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Mark
Stacked InAs quantum dots in InP studied by cross-sectional scanning tunnelling microscopy
(
- Contribution to journal › Article
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Mark
Direct atomically resolved imaging inside a nanowire
2004) 51st Int Symp American Vacuum Soc, Anaheim, Ca, USA (2004)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Direct atomically resolved imaging inside a nanowire
2004) Intl Conf on Scanning Probe Microscopy, Sensors and Nanostruct, Beijing, China (2004)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Direct atomically resolved imaging inside a nanowire
2004) 8th International Conference on Nanometer-Scale Science and Technology, 2004(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
A cross-sectional STM study of nanowhiskers
2004) March Meet of the American Physical Society, 2004(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Influence of the spacer layer distance in stacked InAs/InP quantum dots, studied by cross-sectional scanning tunneling microscopy
2004) 8th International Conference on Nanometer-Scale Science and Technology, 2004(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding