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- 2005
-
Mark
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
Larsson, Erik LU
and Edbom, Stina
(2005)
IFIP WG 10.5 Conference on Very Large Scale Integration System-on-Chip {IFIP VLSI-SOC 2005}
p.429-434
- Contribution to conference › Paper, not in proceeding