1 – 4 of 4
- show: 10
- |
- sort: year (new to old)
Close
Embed this list
<iframe src=" "
width=" "
height=" "
allowtransparency="true"
frameborder="0">
</iframe>
- 2007
-
Mark
Test Data Truncation for Test Quality Maximization under ATE Memory Depth Constraint
(
- Contribution to journal › Article
-
Mark
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
2007) p.221-244(
- Chapter in Book/Report/Conference proceeding › Book chapter
- 2005
-
Mark
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
2005) IFIP WG 10.5 Conference on Very Large Scale Integration System-on-Chip {IFIP VLSI-SOC 2005} p.429-434(
- Contribution to conference › Paper, not in proceeding
- 2004
-
Mark
An Integrated Technique for Test Vector Selection and Test Scheduling under Test Time Constraint
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding