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Investigation of Epitaxial Nd1.85Ce0.15CuO4-y Film Surface by Low Energy Electron Diffractometry

Tsetlin, M. B. ; Zakharov, Alexei LU ; Menushenkov, A. P. ; Ivanov, A. A. ; Mikheeva, M. N. and Lindau, Ingolf LU (2008) In Journal Of Surface Investigation-X-Ray Synchrotron And Neutron Techniques 2(6). p.928-930
Abstract
The surface of epitaxial Nd1.85Ce0.15CuO4-y(001) (NCCO) film has been studied by low energy electron diffractometry (LEED) and photoelectron spectroscopy. Ar+ ion etching of a surface with subsequent annealing in oxygen at atmosphere pressure has been found to lead to the ordered structure restoration of surface layers with the symmetry type and lattice parameters corresponding to the NCCO phase. Annealing in vacuum at temperatures close to the boundary of thermodynamic phase stability results in the formation of epitaxial Ce0.5Nd0.5O1.75 phase on a surface that is indicated in the LEED pattern as additional spots corresponding to the surface lattice (root 2 x root 2) R45 degrees.
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author
; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Journal Of Surface Investigation-X-Ray Synchrotron And Neutron Techniques
volume
2
issue
6
pages
928 - 930
publisher
MAIK Nauka/Interperiodica
external identifiers
  • wos:000262864900018
  • scopus:71449119120
ISSN
1027-4510
DOI
10.1134/S1027451008060189
language
English
LU publication?
yes
id
edf80837-e68e-4ac1-bd95-a56327127aac (old id 1375684)
date added to LUP
2016-04-01 13:58:21
date last changed
2022-01-27 22:06:02
@article{edf80837-e68e-4ac1-bd95-a56327127aac,
  abstract     = {{The surface of epitaxial Nd1.85Ce0.15CuO4-y(001) (NCCO) film has been studied by low energy electron diffractometry (LEED) and photoelectron spectroscopy. Ar+ ion etching of a surface with subsequent annealing in oxygen at atmosphere pressure has been found to lead to the ordered structure restoration of surface layers with the symmetry type and lattice parameters corresponding to the NCCO phase. Annealing in vacuum at temperatures close to the boundary of thermodynamic phase stability results in the formation of epitaxial Ce0.5Nd0.5O1.75 phase on a surface that is indicated in the LEED pattern as additional spots corresponding to the surface lattice (root 2 x root 2) R45 degrees.}},
  author       = {{Tsetlin, M. B. and Zakharov, Alexei and Menushenkov, A. P. and Ivanov, A. A. and Mikheeva, M. N. and Lindau, Ingolf}},
  issn         = {{1027-4510}},
  language     = {{eng}},
  number       = {{6}},
  pages        = {{928--930}},
  publisher    = {{MAIK Nauka/Interperiodica}},
  series       = {{Journal Of Surface Investigation-X-Ray Synchrotron And Neutron Techniques}},
  title        = {{Investigation of Epitaxial Nd1.85Ce0.15CuO4-y Film Surface by Low Energy Electron Diffractometry}},
  url          = {{http://dx.doi.org/10.1134/S1027451008060189}},
  doi          = {{10.1134/S1027451008060189}},
  volume       = {{2}},
  year         = {{2008}},
}