Influence of plasmons on terahertz conductivity measurements
(2005) In Applied Physics Letters 87(1). p.3-012101- Abstract
- Time-domain terahertz spectroscopy allows measuring the complex conductivity spectrum of materials at frequencies on the order of 1 THz. Typically, terahertz (THz) studies produce conductivity spectra that are different from those predicted by the classical Drude model, especially in nanostructured materials. We claim that plasmon resonances in particles that are small compared to the THz wavelength cause these deviations. This is supported by measurements on photoexcited silicon, in bulk as well as in micron-sized particles. In the latter, the behavior is vastly different and strongly dependent on charge carrier concentration.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/157812
- author
- Nienhuys, Han-Kwang LU and Sundström, Villy LU
- organization
- publishing date
- 2005
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Applied Physics Letters
- volume
- 87
- issue
- 1
- pages
- 3 - 012101
- publisher
- American Institute of Physics (AIP)
- external identifiers
-
- wos:000230277900022
- scopus:24144478553
- ISSN
- 0003-6951
- DOI
- 10.1063/1.1977213
- language
- English
- LU publication?
- yes
- additional info
- The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Chemical Physics (S) (011001060)
- id
- caedb2db-2a9e-42fc-bfaf-46b07d95f2a8 (old id 157812)
- date added to LUP
- 2016-04-01 11:35:12
- date last changed
- 2022-03-20 08:05:44
@article{caedb2db-2a9e-42fc-bfaf-46b07d95f2a8, abstract = {{Time-domain terahertz spectroscopy allows measuring the complex conductivity spectrum of materials at frequencies on the order of 1 THz. Typically, terahertz (THz) studies produce conductivity spectra that are different from those predicted by the classical Drude model, especially in nanostructured materials. We claim that plasmon resonances in particles that are small compared to the THz wavelength cause these deviations. This is supported by measurements on photoexcited silicon, in bulk as well as in micron-sized particles. In the latter, the behavior is vastly different and strongly dependent on charge carrier concentration.}}, author = {{Nienhuys, Han-Kwang and Sundström, Villy}}, issn = {{0003-6951}}, language = {{eng}}, number = {{1}}, pages = {{3--012101}}, publisher = {{American Institute of Physics (AIP)}}, series = {{Applied Physics Letters}}, title = {{Influence of plasmons on terahertz conductivity measurements}}, url = {{http://dx.doi.org/10.1063/1.1977213}}, doi = {{10.1063/1.1977213}}, volume = {{87}}, year = {{2005}}, }