Beaming effect of optical near-field in multiple metallic slits with nanometric linewidth and micrometer pitch
Wei, P K ; Chou, H L ; Cheng, Y R ; Wei, C H ; Fann, W and Tegenfeldt, Jonas LU
(2005)
In Optics Communications
253(1-3).
p.198-204
- Abstract
- The beaming effect and interference patterns on the exit surface of multiple nano metallic slits with micrometer pitch were observed by scanning near-field optical microscopy. The near-field light intensity for multiple slits had a longer propagation tail and a smaller diverging angle as compared to that in a single slit. From finite-difference time-domain calculations, we verify that these fringe patterns come from the interference effect of longitudinal electric field, which is propagating along the surface. The beaming light in the slit openings is also attributed to the addition of longitudinal fields.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/226194
- author
- Wei, P K
; Chou, H L
; Cheng, Y R
; Wei, C H
; Fann, W
and Tegenfeldt, Jonas
LU
- organization
- publishing date
- 2005
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- near-field scanning optical microscopes
- in
- Optics Communications
- volume
- 253
- issue
- 1-3
- pages
- 198 - 204
- publisher
- Elsevier
- external identifiers
-
- wos:000231519600025
- scopus:23844442826
- ISSN
- 0030-4018
- DOI
- 10.1016/j.optcom.2005.04.041
- language
- English
- LU publication?
- yes
- id
- b5bd70ad-7f4b-4b95-b2d9-7a6653466103 (old id 226194)
- date added to LUP
- 2016-04-01 16:55:39
- date last changed
- 2022-01-28 23:06:39
@article{b5bd70ad-7f4b-4b95-b2d9-7a6653466103,
abstract = {{The beaming effect and interference patterns on the exit surface of multiple nano metallic slits with micrometer pitch were observed by scanning near-field optical microscopy. The near-field light intensity for multiple slits had a longer propagation tail and a smaller diverging angle as compared to that in a single slit. From finite-difference time-domain calculations, we verify that these fringe patterns come from the interference effect of longitudinal electric field, which is propagating along the surface. The beaming light in the slit openings is also attributed to the addition of longitudinal fields.}},
author = {{Wei, P K and Chou, H L and Cheng, Y R and Wei, C H and Fann, W and Tegenfeldt, Jonas}},
issn = {{0030-4018}},
keywords = {{near-field scanning optical microscopes}},
language = {{eng}},
number = {{1-3}},
pages = {{198--204}},
publisher = {{Elsevier}},
series = {{Optics Communications}},
title = {{Beaming effect of optical near-field in multiple metallic slits with nanometric linewidth and micrometer pitch}},
url = {{http://dx.doi.org/10.1016/j.optcom.2005.04.041}},
doi = {{10.1016/j.optcom.2005.04.041}},
volume = {{253}},
year = {{2005}},
}