Scan Cells Reordering to Minimize Peak Power During Test Cycle : A Graph Theoretic Approach
(2010) IEEE European Test Symposium (ETS'10), 2010 p.259-259- Abstract
- Scan circuit is widely practiced DFT technology. The scan testing procedure consist of state initialization, test application, response capture and observation process. During the state initialization process the scan vectors are shifted into the scan cells and simultaneously the responses captured in last cycle are shifted out. During this shift operation the transitions that arise in the scan cells are propagated to the combinational circuit, which inturn create many more toggling activities in the combinational block and hence increases the dynamic power consumption. The dynamic power consumed during scan shift operation is much more higher than that of normal mode operation.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2340837
- author
- Tudu, Jaynarayan T. ; Larsson, Erik LU ; Singh, Virendra and Fujiwara, Hideo
- publishing date
- 2010
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- [Host publication title missing]
- pages
- 259 - 259
- conference name
- IEEE European Test Symposium (ETS'10), 2010
- conference location
- Prague, Czech Republic
- conference dates
- 2010-05-24 - 2010-05-28
- external identifiers
-
- scopus:78049258396
- DOI
- 10.1109/ETSYM.2010.5512732
- language
- English
- LU publication?
- no
- id
- 1cdb0482-1aca-4f09-858e-2c02e066d4f8 (old id 2340837)
- date added to LUP
- 2016-04-04 12:57:15
- date last changed
- 2022-01-29 23:35:53
@inproceedings{1cdb0482-1aca-4f09-858e-2c02e066d4f8, abstract = {{Scan circuit is widely practiced DFT technology. The scan testing procedure consist of state initialization, test application, response capture and observation process. During the state initialization process the scan vectors are shifted into the scan cells and simultaneously the responses captured in last cycle are shifted out. During this shift operation the transitions that arise in the scan cells are propagated to the combinational circuit, which inturn create many more toggling activities in the combinational block and hence increases the dynamic power consumption. The dynamic power consumed during scan shift operation is much more higher than that of normal mode operation.}}, author = {{Tudu, Jaynarayan T. and Larsson, Erik and Singh, Virendra and Fujiwara, Hideo}}, booktitle = {{[Host publication title missing]}}, language = {{eng}}, pages = {{259--259}}, title = {{Scan Cells Reordering to Minimize Peak Power During Test Cycle : A Graph Theoretic Approach}}, url = {{http://dx.doi.org/10.1109/ETSYM.2010.5512732}}, doi = {{10.1109/ETSYM.2010.5512732}}, year = {{2010}}, }