Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules
(2010) IEEE East-West Design and Test Symposium (EWDTS10)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2340884
- author
- Vinay, N.S. ; Rawat, Indira ; Gaur, M.S. ; Larsson, Erik LU and Singh, Virendra
- publishing date
- 2010
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- Design & Test Symposium (EWDTS), 2010 East-West
- conference name
- IEEE East-West Design and Test Symposium (EWDTS10)
- conference location
- St. Petersburg, Russian Federation
- conference dates
- 2010-09-17 - 2010-09-20
- external identifiers
-
- scopus:79955954690
- ISBN
- 978-1-4244-9555-9
- DOI
- 10.1109/EWDTS.2010.5742053
- language
- English
- LU publication?
- no
- id
- 4d055bb4-89c5-4133-80b8-b5b30377249b (old id 2340884)
- date added to LUP
- 2016-04-04 14:24:14
- date last changed
- 2022-01-30 02:39:00
@inproceedings{4d055bb4-89c5-4133-80b8-b5b30377249b, author = {{Vinay, N.S. and Rawat, Indira and Gaur, M.S. and Larsson, Erik and Singh, Virendra}}, booktitle = {{Design & Test Symposium (EWDTS), 2010 East-West}}, isbn = {{978-1-4244-9555-9}}, language = {{eng}}, title = {{Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules}}, url = {{http://dx.doi.org/10.1109/EWDTS.2010.5742053}}, doi = {{10.1109/EWDTS.2010.5742053}}, year = {{2010}}, }