SOC Test Scheduling with Test Set Sharing and Broadcasting
(2005) IEEE Asian Test Symposium p.162-162- Abstract
- Due to the increasing test data volume needed to test core-based System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In contrast to approaches where a fixed test set for each core is assumed, we explore the possibility to use overlapping test patterns from the tests in the system. The overlapping tests serves as alternatives to the original dedicated test for the cores and, if selected, they are transported to the cores in a broadcasted manner so that several cores are tested concurrently. We have made use of a Constraint Logic Programming technique to select suitable tests for each core in the system and schedule the selected tests such that the test application time is minimized... (More)
- Due to the increasing test data volume needed to test core-based System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In contrast to approaches where a fixed test set for each core is assumed, we explore the possibility to use overlapping test patterns from the tests in the system. The overlapping tests serves as alternatives to the original dedicated test for the cores and, if selected, they are transported to the cores in a broadcasted manner so that several cores are tested concurrently. We have made use of a Constraint Logic Programming technique to select suitable tests for each core in the system and schedule the selected tests such that the test application time is minimized while designer-specified hardware constraints are satisfied. The experimental results indicate that we can on average reduce the test application time with 23%. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2341044
- author
- Larsson, Anders ; Larsson, Erik LU ; Eles, Petru Ion and Peng, Zebo
- publishing date
- 2005
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- testing, system-on-chip, test scheduling, overlapping test patterns, constraint logic programming
- host publication
- [Host publication title missing]
- pages
- 162 - 162
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- IEEE Asian Test Symposium
- conference location
- Calcutta, India
- conference dates
- 2005-12-18 - 2005-12-21
- external identifiers
-
- scopus:33846929949
- DOI
- 10.1109/ATS.2005.100
- language
- English
- LU publication?
- no
- id
- 9bee3c19-af5d-4dce-948a-e976947bfe68 (old id 2341044)
- date added to LUP
- 2016-04-04 11:56:08
- date last changed
- 2022-04-24 01:23:32
@inproceedings{9bee3c19-af5d-4dce-948a-e976947bfe68, abstract = {{Due to the increasing test data volume needed to test core-based System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In contrast to approaches where a fixed test set for each core is assumed, we explore the possibility to use overlapping test patterns from the tests in the system. The overlapping tests serves as alternatives to the original dedicated test for the cores and, if selected, they are transported to the cores in a broadcasted manner so that several cores are tested concurrently. We have made use of a Constraint Logic Programming technique to select suitable tests for each core in the system and schedule the selected tests such that the test application time is minimized while designer-specified hardware constraints are satisfied. The experimental results indicate that we can on average reduce the test application time with 23%.}}, author = {{Larsson, Anders and Larsson, Erik and Eles, Petru Ion and Peng, Zebo}}, booktitle = {{[Host publication title missing]}}, keywords = {{testing; system-on-chip; test scheduling; overlapping test patterns; constraint logic programming}}, language = {{eng}}, pages = {{162--162}}, publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}}, title = {{SOC Test Scheduling with Test Set Sharing and Broadcasting}}, url = {{http://dx.doi.org/10.1109/ATS.2005.100}}, doi = {{10.1109/ATS.2005.100}}, year = {{2005}}, }