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Decay of core excitations in bulk h-BN studied with resonant Auger spectroscopy

Preobrajenski, Alexei LU ; Vinogradov, A S and Mårtensson, Nils LU (2005) In Journal of Electron Spectroscopy and Related Phenomena 148(1). p.59-64
Abstract
Non-radiative decay of core excitations at the B 1s and N 1s absorption edges of bulk hexagonal boron nitride (h-BN) has been studied with resonant Auger spectroscopy. In order to reproduce the bulk properties of the sample while keeping it electrically conducting, we have grown reasonably thick (more than 20nm) polycrystalline films of h-BN on a Ni(111) surface by thermal cracking of borazine vapor. The probability of the participator Auger process in the non-radiative decay of the B 1s(-1) pi* and N 1s(-1) pi* excitations has been found to be very high (31%) and rather low (below 0.5%), respectively. The drastic difference between the participator Auger decay probabilities of these two excitations has been explained in terms of different... (More)
Non-radiative decay of core excitations at the B 1s and N 1s absorption edges of bulk hexagonal boron nitride (h-BN) has been studied with resonant Auger spectroscopy. In order to reproduce the bulk properties of the sample while keeping it electrically conducting, we have grown reasonably thick (more than 20nm) polycrystalline films of h-BN on a Ni(111) surface by thermal cracking of borazine vapor. The probability of the participator Auger process in the non-radiative decay of the B 1s(-1) pi* and N 1s(-1) pi* excitations has been found to be very high (31%) and rather low (below 0.5%), respectively. The drastic difference between the participator Auger decay probabilities of these two excitations has been explained in terms of different localization of the electrons promoted into the lowest unoccupied pi* state on the cationic (B) and anionic (N) sites. (Less)
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author
; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
resonant Auger, photoelectron spectroscopy, boron nitride, NEXAFS, spectroscopy
in
Journal of Electron Spectroscopy and Related Phenomena
volume
148
issue
1
pages
59 - 64
publisher
Elsevier
external identifiers
  • wos:000229903200009
  • scopus:18544390831
ISSN
0368-2048
DOI
10.1016/j.elspec.2005.02.005
language
English
LU publication?
yes
id
9bb5f8f2-d0e7-4cb3-8d72-54ec8e9ce57d (old id 235659)
date added to LUP
2016-04-01 16:50:34
date last changed
2022-01-28 22:33:58
@article{9bb5f8f2-d0e7-4cb3-8d72-54ec8e9ce57d,
  abstract     = {{Non-radiative decay of core excitations at the B 1s and N 1s absorption edges of bulk hexagonal boron nitride (h-BN) has been studied with resonant Auger spectroscopy. In order to reproduce the bulk properties of the sample while keeping it electrically conducting, we have grown reasonably thick (more than 20nm) polycrystalline films of h-BN on a Ni(111) surface by thermal cracking of borazine vapor. The probability of the participator Auger process in the non-radiative decay of the B 1s(-1) pi* and N 1s(-1) pi* excitations has been found to be very high (31%) and rather low (below 0.5%), respectively. The drastic difference between the participator Auger decay probabilities of these two excitations has been explained in terms of different localization of the electrons promoted into the lowest unoccupied pi* state on the cationic (B) and anionic (N) sites.}},
  author       = {{Preobrajenski, Alexei and Vinogradov, A S and Mårtensson, Nils}},
  issn         = {{0368-2048}},
  keywords     = {{resonant Auger; photoelectron spectroscopy; boron nitride; NEXAFS; spectroscopy}},
  language     = {{eng}},
  number       = {{1}},
  pages        = {{59--64}},
  publisher    = {{Elsevier}},
  series       = {{Journal of Electron Spectroscopy and Related Phenomena}},
  title        = {{Decay of core excitations in bulk h-BN studied with resonant Auger spectroscopy}},
  url          = {{http://dx.doi.org/10.1016/j.elspec.2005.02.005}},
  doi          = {{10.1016/j.elspec.2005.02.005}},
  volume       = {{148}},
  year         = {{2005}},
}