Recent advances in imaging of properties and growth of low dimensional structures for photonics and electronics by XPEEM
(2012) In Journal of Electron Spectroscopy and Related Phenomena 185(10). p.417-428- Abstract
- Spectroscopic Photoemission and Low Energy Electron Microscopy (SPELEEM) is a very powerful and diverse microscopy technique for the investigation of surfaces, interfaces, buried layers and nanoscale objects like nanoparticles and nanowires. The many significant results from photoemission Electron microscopy (PEEM) in recent years are linked with the exploitation of advanced light sources such as synchrotrons and new advanced laser systems. Combined also with low energy electron microscopy (LEEM) it allows a complementary chemical and structural analysis making LEEM/PEEM a versatile multitechnique instrument. To illustrate the extreme diversity, we give a summary of the recent studies with the SPELEEM installed at the soft X-ray beamline... (More)
- Spectroscopic Photoemission and Low Energy Electron Microscopy (SPELEEM) is a very powerful and diverse microscopy technique for the investigation of surfaces, interfaces, buried layers and nanoscale objects like nanoparticles and nanowires. The many significant results from photoemission Electron microscopy (PEEM) in recent years are linked with the exploitation of advanced light sources such as synchrotrons and new advanced laser systems. Combined also with low energy electron microscopy (LEEM) it allows a complementary chemical and structural analysis making LEEM/PEEM a versatile multitechnique instrument. To illustrate the extreme diversity, we give a summary of the recent studies with the SPELEEM installed at the soft X-ray beamline 1311 at the MAXII synchrotron storage ring and a portable electrostatic PEEM used with ultra-fast XUV laser technology. The examples cover topics such as full-cone 3D band mapping by using the photoelectron diffraction mode of the microscope, growth mechanism and detailed doping profile of III-V nanowires, growth and intercalation of graphene on SiC substrates, droplet dynamics on GaP(1 1 1) surface, surface chemistry and control of nanostructure fabrication. Moreover, the first results of PEEM experiments using extreme ultraviolet attosecond pulse trains are discussed. (C) 2012 Elsevier B.V. All rights reserved. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/3511102
- author
- Zakharov, Alexei LU ; Mikkelsen, Anders LU and Andersen, Jesper N LU
- organization
- publishing date
- 2012
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- XPEEM, Nanowires, Graphene, Droplet dynamics, Short-pulse laser
- in
- Journal of Electron Spectroscopy and Related Phenomena
- volume
- 185
- issue
- 10
- pages
- 417 - 428
- publisher
- Elsevier
- external identifiers
-
- wos:000312979400014
- scopus:84870054870
- ISSN
- 0368-2048
- DOI
- 10.1016/j.elspec.2012.03.002
- language
- English
- LU publication?
- yes
- id
- 7375b6af-320c-41a5-8594-6044d53e9e66 (old id 3511102)
- date added to LUP
- 2016-04-01 13:56:05
- date last changed
- 2022-04-22 00:32:44
@article{7375b6af-320c-41a5-8594-6044d53e9e66, abstract = {{Spectroscopic Photoemission and Low Energy Electron Microscopy (SPELEEM) is a very powerful and diverse microscopy technique for the investigation of surfaces, interfaces, buried layers and nanoscale objects like nanoparticles and nanowires. The many significant results from photoemission Electron microscopy (PEEM) in recent years are linked with the exploitation of advanced light sources such as synchrotrons and new advanced laser systems. Combined also with low energy electron microscopy (LEEM) it allows a complementary chemical and structural analysis making LEEM/PEEM a versatile multitechnique instrument. To illustrate the extreme diversity, we give a summary of the recent studies with the SPELEEM installed at the soft X-ray beamline 1311 at the MAXII synchrotron storage ring and a portable electrostatic PEEM used with ultra-fast XUV laser technology. The examples cover topics such as full-cone 3D band mapping by using the photoelectron diffraction mode of the microscope, growth mechanism and detailed doping profile of III-V nanowires, growth and intercalation of graphene on SiC substrates, droplet dynamics on GaP(1 1 1) surface, surface chemistry and control of nanostructure fabrication. Moreover, the first results of PEEM experiments using extreme ultraviolet attosecond pulse trains are discussed. (C) 2012 Elsevier B.V. All rights reserved.}}, author = {{Zakharov, Alexei and Mikkelsen, Anders and Andersen, Jesper N}}, issn = {{0368-2048}}, keywords = {{XPEEM; Nanowires; Graphene; Droplet dynamics; Short-pulse laser}}, language = {{eng}}, number = {{10}}, pages = {{417--428}}, publisher = {{Elsevier}}, series = {{Journal of Electron Spectroscopy and Related Phenomena}}, title = {{Recent advances in imaging of properties and growth of low dimensional structures for photonics and electronics by XPEEM}}, url = {{http://dx.doi.org/10.1016/j.elspec.2012.03.002}}, doi = {{10.1016/j.elspec.2012.03.002}}, volume = {{185}}, year = {{2012}}, }