Electron microscopy study of single crystal BaZr0.9Y0.1O3-x films prepared by chemical solution deposition
(2012) Symposium on Ionic and Mixed Conducting Ceramics 8 45(1). p.121-127- Abstract
- Single crystal thin films of 10% yttrium doped barium zirconate (BZY10) have been prepared using chemical solution deposition on magnesium oxide substrates and annealed at 800 or 1000 degrees C. A focused ion beam lift out technique was used to prepare thin (< 100 nm) specimens for transmission electron microscopy (TEM) analysis. A variety of TEM based techniques were used for characterization, including high resolution imaging, X-ray energy dispersive spectroscopy and energy filtered TEM. High resolution TEM imaging indicated a high quality single crystal film with an epitaxial cube on cube type interface between BZY10 and MgO. For the sample annealed 1000 degrees C, annular dark field imaging in scanning transmission electron... (More)
- Single crystal thin films of 10% yttrium doped barium zirconate (BZY10) have been prepared using chemical solution deposition on magnesium oxide substrates and annealed at 800 or 1000 degrees C. A focused ion beam lift out technique was used to prepare thin (< 100 nm) specimens for transmission electron microscopy (TEM) analysis. A variety of TEM based techniques were used for characterization, including high resolution imaging, X-ray energy dispersive spectroscopy and energy filtered TEM. High resolution TEM imaging indicated a high quality single crystal film with an epitaxial cube on cube type interface between BZY10 and MgO. For the sample annealed 1000 degrees C, annular dark field imaging in scanning transmission electron microscopy (STEM) mode showed a layered pattern of lower intensity in the single crystal film. Energy filtered TEM thickness map together with scanning electron microscopy (SEM) indicate the pattern consists of partially repeating voids. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/3764991
- author
- Lenrick, Filip LU ; Griesche, D. ; Kim, J. -W. ; Schneller, T. and Wallenberg, Reine LU
- organization
- publishing date
- 2012
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- ECS Transactions
- volume
- 45
- issue
- 1
- pages
- 121 - 127
- publisher
- Electrochemical Society
- conference name
- Symposium on Ionic and Mixed Conducting Ceramics 8
- conference dates
- 2012-05-06 - 2012-05-10
- external identifiers
-
- wos:000316692900014
- scopus:84869007905
- ISSN
- 1938-5862
- 1938-6737
- DOI
- 10.1149/1.3701300
- language
- English
- LU publication?
- yes
- additional info
- The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Polymer and Materials Chemistry (LTH) (011001041)
- id
- ceef3f99-48c6-42c5-b04b-e124d77aa7c6 (old id 3764991)
- date added to LUP
- 2016-04-01 10:04:21
- date last changed
- 2024-07-28 11:59:47
@inproceedings{ceef3f99-48c6-42c5-b04b-e124d77aa7c6, abstract = {{Single crystal thin films of 10% yttrium doped barium zirconate (BZY10) have been prepared using chemical solution deposition on magnesium oxide substrates and annealed at 800 or 1000 degrees C. A focused ion beam lift out technique was used to prepare thin (< 100 nm) specimens for transmission electron microscopy (TEM) analysis. A variety of TEM based techniques were used for characterization, including high resolution imaging, X-ray energy dispersive spectroscopy and energy filtered TEM. High resolution TEM imaging indicated a high quality single crystal film with an epitaxial cube on cube type interface between BZY10 and MgO. For the sample annealed 1000 degrees C, annular dark field imaging in scanning transmission electron microscopy (STEM) mode showed a layered pattern of lower intensity in the single crystal film. Energy filtered TEM thickness map together with scanning electron microscopy (SEM) indicate the pattern consists of partially repeating voids.}}, author = {{Lenrick, Filip and Griesche, D. and Kim, J. -W. and Schneller, T. and Wallenberg, Reine}}, booktitle = {{ECS Transactions}}, issn = {{1938-5862}}, language = {{eng}}, number = {{1}}, pages = {{121--127}}, publisher = {{Electrochemical Society}}, title = {{Electron microscopy study of single crystal BaZr0.9Y0.1O3-x films prepared by chemical solution deposition}}, url = {{http://dx.doi.org/10.1149/1.3701300}}, doi = {{10.1149/1.3701300}}, volume = {{45}}, year = {{2012}}, }