Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline
(2019) In Crystals 9(8).- Abstract
The advent of nanofocused X-ray beams has allowed the study of single nanocrystals and complete nanoscale devices in a nondestructive manner, using techniques such as scanning transmission X-ray microscopy (STXM), X-ray fluorescence (XRF) and X-ray diffraction (XRD). Further insight into semiconductor devices can be achieved by combining these techniques with simultaneous electrical measurements. Here, we present a system for electrical biasing and current measurement of single nanostructure devices, which has been developed for the NanoMAX beamline at the fourth-generation synchrotron, MAX IV, Sweden. The system was tested on single InP nanowire devices. The mechanical stability was sufficient to collect scanning XRD and XRF maps with... (More)
The advent of nanofocused X-ray beams has allowed the study of single nanocrystals and complete nanoscale devices in a nondestructive manner, using techniques such as scanning transmission X-ray microscopy (STXM), X-ray fluorescence (XRF) and X-ray diffraction (XRD). Further insight into semiconductor devices can be achieved by combining these techniques with simultaneous electrical measurements. Here, we present a system for electrical biasing and current measurement of single nanostructure devices, which has been developed for the NanoMAX beamline at the fourth-generation synchrotron, MAX IV, Sweden. The system was tested on single InP nanowire devices. The mechanical stability was sufficient to collect scanning XRD and XRF maps with a 50 nm diameter focus. The dark noise of the current measurement system was about 3 fA, which allowed fly scan measurements of X-ray beam induced current (XBIC) in single nanowire devices.
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- author
- Chayanun, Lert LU ; Hammarberg, Susanna LU ; Dierks, Hanna LU ; Otnes, Gaute LU ; Björling, Alexander LU ; Borgström, Magnus T. LU and Wallentin, Jesper LU
- organization
- publishing date
- 2019-08-01
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- Nanowire, Scanning X-ray diffraction (XRD), X-ray beam induced current (XBIC)
- in
- Crystals
- volume
- 9
- issue
- 8
- article number
- 432
- publisher
- MDPI AG
- external identifiers
-
- scopus:85073368394
- ISSN
- 2073-4352
- DOI
- 10.3390/cryst9080432
- language
- English
- LU publication?
- yes
- id
- 8e99c8a4-87d6-4c85-b531-50690f26989f
- date added to LUP
- 2019-10-25 08:10:34
- date last changed
- 2024-01-31 09:58:08
@article{8e99c8a4-87d6-4c85-b531-50690f26989f, abstract = {{<p>The advent of nanofocused X-ray beams has allowed the study of single nanocrystals and complete nanoscale devices in a nondestructive manner, using techniques such as scanning transmission X-ray microscopy (STXM), X-ray fluorescence (XRF) and X-ray diffraction (XRD). Further insight into semiconductor devices can be achieved by combining these techniques with simultaneous electrical measurements. Here, we present a system for electrical biasing and current measurement of single nanostructure devices, which has been developed for the NanoMAX beamline at the fourth-generation synchrotron, MAX IV, Sweden. The system was tested on single InP nanowire devices. The mechanical stability was sufficient to collect scanning XRD and XRF maps with a 50 nm diameter focus. The dark noise of the current measurement system was about 3 fA, which allowed fly scan measurements of X-ray beam induced current (XBIC) in single nanowire devices.</p>}}, author = {{Chayanun, Lert and Hammarberg, Susanna and Dierks, Hanna and Otnes, Gaute and Björling, Alexander and Borgström, Magnus T. and Wallentin, Jesper}}, issn = {{2073-4352}}, keywords = {{Nanowire; Scanning X-ray diffraction (XRD); X-ray beam induced current (XBIC)}}, language = {{eng}}, month = {{08}}, number = {{8}}, publisher = {{MDPI AG}}, series = {{Crystals}}, title = {{Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline}}, url = {{http://dx.doi.org/10.3390/cryst9080432}}, doi = {{10.3390/cryst9080432}}, volume = {{9}}, year = {{2019}}, }