An Accurate Analysis of Phase Noise in CMOS Ring Oscillators
(2018) In IEEE Transactions on Circuits and Systems II: Express Briefs p.1-1- Abstract
We present an accurate analysis of phase noise in ring oscillators, where each stage in the ring is a CMOS inverter loaded by a capacitance. Closed-form phase noise expressions are obtained in both 1/f2 and 1/f3 offset frequency regions, displaying an excellent agreement with numerical simulations using either ideal Verilog-A MOS models (allowing theoretical predictions to be tested with exactly the same assumptions under which they were derived), or commercial BSIM4 MOS models.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/b97c09bc-9e4b-4319-8167-9209a4fa6807
- author
- Pepe, Federico LU and Andreani, Pietro LU
- organization
- publishing date
- 2018
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- impulse sensitivity function (ISF)., Phase noise, ring oscillators
- in
- IEEE Transactions on Circuits and Systems II: Express Briefs
- pages
- 1 - 1
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- external identifiers
-
- scopus:85057832563
- ISSN
- 1549-7747
- DOI
- 10.1109/TCSII.2018.2884569
- language
- English
- LU publication?
- yes
- id
- b97c09bc-9e4b-4319-8167-9209a4fa6807
- date added to LUP
- 2018-12-21 10:59:34
- date last changed
- 2022-05-11 03:54:28
@article{b97c09bc-9e4b-4319-8167-9209a4fa6807, abstract = {{<p>We present an accurate analysis of phase noise in ring oscillators, where each stage in the ring is a CMOS inverter loaded by a capacitance. Closed-form phase noise expressions are obtained in both 1/f2 and 1/f3 offset frequency regions, displaying an excellent agreement with numerical simulations using either ideal Verilog-A MOS models (allowing theoretical predictions to be tested with exactly the same assumptions under which they were derived), or commercial BSIM4 MOS models.</p>}}, author = {{Pepe, Federico and Andreani, Pietro}}, issn = {{1549-7747}}, keywords = {{impulse sensitivity function (ISF).; Phase noise; ring oscillators}}, language = {{eng}}, pages = {{1--1}}, publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}}, series = {{IEEE Transactions on Circuits and Systems II: Express Briefs}}, title = {{An Accurate Analysis of Phase Noise in CMOS Ring Oscillators}}, url = {{http://dx.doi.org/10.1109/TCSII.2018.2884569}}, doi = {{10.1109/TCSII.2018.2884569}}, year = {{2018}}, }