Systemkretsar ställer nya krav på testningen
Larsson, Erik LU
(2018)
In Elektroniktidningen
p.14-14
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/001b1d5f-2e12-40ed-9269-bfbaaffac3cf
- author
- Larsson, Erik
LU
- organization
- alternative title
- System-on-chip requires new demands on testing
- publishing date
- 2018-08
- type
- Contribution to specialist publication or newspaper
- publication status
- published
- subject
- categories
- Popular Science
- in
- Elektroniktidningen
- issue
- 7-8/2018
- pages
- 15 pages
- language
- Swedish
- LU publication?
- yes
- id
- 001b1d5f-2e12-40ed-9269-bfbaaffac3cf
- alternative location
- http://etn.se/index.php/reportage/65023-systemkretsar-staller-nya-krav-pa-testningen.html
- date added to LUP
- 2018-10-04 08:26:27
- date last changed
- 2018-11-21 21:41:58
@article{001b1d5f-2e12-40ed-9269-bfbaaffac3cf,
author = {{Larsson, Erik}},
language = {{swe}},
number = {{7-8/2018}},
pages = {{14--14}},
series = {{Elektroniktidningen}},
title = {{Systemkretsar ställer nya krav på testningen}},
url = {{http://etn.se/index.php/reportage/65023-systemkretsar-staller-nya-krav-pa-testningen.html}},
year = {{2018}},
}