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Proton-Induced X-Ray Emission in the Trace Analysis of Human Tooth Enamel and Dentine

Ahlberg, Mats and Akselsson, Roland LU (1976) In International Journal of Applied Radiation and Isotopes 27(5-6). p.279-290
Abstract
In this study the feasibility of applying proton-induced X-ray emission spectroscopy (PIXE) to the trace element analysis of human tooth enamel and dentine is investigated. Detection limits on the order of 1–10 ppm are obtained. Depth yields for different elements and proton energies are discussed. Enhancement calculations show that the effect for PIXE analysis is less important than for X-ray induced X-ray analysis. However, for elements with an absorption edge just below an intense X-ray line from a major element the enhancement effect is significant, and, due to the 40% calcium in the enamel matrix, it is estimated to be 15% for potassium. The importance of a smooth sample surface is discussed.
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author
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organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
PIXE, trace elements in teeth
in
International Journal of Applied Radiation and Isotopes
volume
27
issue
5-6
pages
279 - 290
publisher
Elsevier
external identifiers
  • scopus:0016950749
DOI
10.1016/0020-708X(76)90145-9
language
English
LU publication?
yes
additional info
The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Nuclear Physics (Faculty of Technology) (011013007), Division of Occupational and Environmental Medicine (013078001), Ergonomics and Aerosol Technology (011025002)
id
c77442c3-f442-463c-8a59-3f4e35e99e8f (old id 1751040)
date added to LUP
2016-04-04 11:00:48
date last changed
2021-01-03 10:41:06
@article{c77442c3-f442-463c-8a59-3f4e35e99e8f,
  abstract     = {{In this study the feasibility of applying proton-induced X-ray emission spectroscopy (PIXE) to the trace element analysis of human tooth enamel and dentine is investigated. Detection limits on the order of 1–10 ppm are obtained. Depth yields for different elements and proton energies are discussed. Enhancement calculations show that the effect for PIXE analysis is less important than for X-ray induced X-ray analysis. However, for elements with an absorption edge just below an intense X-ray line from a major element the enhancement effect is significant, and, due to the 40% calcium in the enamel matrix, it is estimated to be 15% for potassium. The importance of a smooth sample surface is discussed.}},
  author       = {{Ahlberg, Mats and Akselsson, Roland}},
  keywords     = {{PIXE; trace elements in teeth}},
  language     = {{eng}},
  number       = {{5-6}},
  pages        = {{279--290}},
  publisher    = {{Elsevier}},
  series       = {{International Journal of Applied Radiation and Isotopes}},
  title        = {{Proton-Induced X-Ray Emission in the Trace Analysis of Human Tooth Enamel and Dentine}},
  url          = {{http://dx.doi.org/10.1016/0020-708X(76)90145-9}},
  doi          = {{10.1016/0020-708X(76)90145-9}},
  volume       = {{27}},
  year         = {{1976}},
}