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On the Optical Properties of Thin-Film Vanadium Dioxide from the Visible to the Far Infrared

Wan, Chenghao ; Zhang, Zhen ; Woolf, David ; Hessel, Colin M. ; Rensberg, Jura ; Hensley, Joel M. ; Xiao, Yuzhe ; Shahsafi, Alireza ; Salman, Jad and Richter, Steffen LU , et al. (2019) In Annalen der Physik 531(10).
Abstract

The insulator-to-metal transition (IMT) in vanadium dioxide (VO2) can enable a variety of optics applications, including switching and modulation, optical limiting, and tuning of optical resonators. Despite the widespread interest in VO2 for optics, the wavelength-dependent optical properties across its IMT are scattered throughout the literature, are sometimes contradictory, and are not available at all in some wavelength regions. Here, the complex refractive index of VO2 thin films across the IMT is characterized for free-space wavelengths from 300 nm to 30 µm, using broadband spectroscopic ellipsometry, reflection spectroscopy, and the application of effective-medium theory. VO2 films of... (More)

The insulator-to-metal transition (IMT) in vanadium dioxide (VO2) can enable a variety of optics applications, including switching and modulation, optical limiting, and tuning of optical resonators. Despite the widespread interest in VO2 for optics, the wavelength-dependent optical properties across its IMT are scattered throughout the literature, are sometimes contradictory, and are not available at all in some wavelength regions. Here, the complex refractive index of VO2 thin films across the IMT is characterized for free-space wavelengths from 300 nm to 30 µm, using broadband spectroscopic ellipsometry, reflection spectroscopy, and the application of effective-medium theory. VO2 films of different thicknesses are studied, on two different substrates (silicon and sapphire), and grown using different synthesis methods (sputtering and sol–gel). While there are differences in the optical properties of VO2 synthesized under different conditions, these differences are surprisingly small in the ≈2–11 µm range where the insulating phase of VO2 also has relatively low optical loss. It is anticipated that the refractive-index datasets from this article will be broadly useful for modeling and design of VO2-based optical and optoelectronic components, especially in the mid-wave and long-wave infrared.

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publishing date
type
Contribution to journal
publication status
published
keywords
ellipsometry, insulator-to-metal transition, optical thin films, vanadium dioxide
in
Annalen der Physik
volume
531
issue
10
article number
1900188
publisher
John Wiley & Sons Inc.
external identifiers
  • scopus:85070881914
ISSN
0003-3804
DOI
10.1002/andp.201900188
language
English
LU publication?
no
additional info
Publisher Copyright: © 2019 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
id
22bc3152-327b-4351-9d02-2b15a8f47650
date added to LUP
2022-04-19 14:48:53
date last changed
2023-12-18 14:50:06
@article{22bc3152-327b-4351-9d02-2b15a8f47650,
  abstract     = {{<p>The insulator-to-metal transition (IMT) in vanadium dioxide (VO<sub>2</sub>) can enable a variety of optics applications, including switching and modulation, optical limiting, and tuning of optical resonators. Despite the widespread interest in VO<sub>2</sub> for optics, the wavelength-dependent optical properties across its IMT are scattered throughout the literature, are sometimes contradictory, and are not available at all in some wavelength regions. Here, the complex refractive index of VO<sub>2</sub> thin films across the IMT is characterized for free-space wavelengths from 300 nm to 30 µm, using broadband spectroscopic ellipsometry, reflection spectroscopy, and the application of effective-medium theory. VO<sub>2</sub> films of different thicknesses are studied, on two different substrates (silicon and sapphire), and grown using different synthesis methods (sputtering and sol–gel). While there are differences in the optical properties of VO<sub>2</sub> synthesized under different conditions, these differences are surprisingly small in the ≈2–11 µm range where the insulating phase of VO<sub>2</sub> also has relatively low optical loss. It is anticipated that the refractive-index datasets from this article will be broadly useful for modeling and design of VO<sub>2</sub>-based optical and optoelectronic components, especially in the mid-wave and long-wave infrared.</p>}},
  author       = {{Wan, Chenghao and Zhang, Zhen and Woolf, David and Hessel, Colin M. and Rensberg, Jura and Hensley, Joel M. and Xiao, Yuzhe and Shahsafi, Alireza and Salman, Jad and Richter, Steffen and Sun, Yifei and Qazilbash, M. Mumtaz and Schmidt-Grund, Rüdiger and Ronning, Carsten and Ramanathan, Shriram and Kats, Mikhail A.}},
  issn         = {{0003-3804}},
  keywords     = {{ellipsometry; insulator-to-metal transition; optical thin films; vanadium dioxide}},
  language     = {{eng}},
  month        = {{10}},
  number       = {{10}},
  publisher    = {{John Wiley & Sons Inc.}},
  series       = {{Annalen der Physik}},
  title        = {{On the Optical Properties of Thin-Film Vanadium Dioxide from the Visible to the Far Infrared}},
  url          = {{http://dx.doi.org/10.1002/andp.201900188}},
  doi          = {{10.1002/andp.201900188}},
  volume       = {{531}},
  year         = {{2019}},
}