In situ passivation monitoring of Ti-6Al-4V in 3.5 wt% NaCl solution using ECAFM
(2025) In Corrosion Science 255.- Abstract
This study systematically investigates the passivation and dissolution mechanisms of TC4 (Ti-6Al-4V) in 3.5 wt% NaCl solution using in situ electrochemical atomic force microscopy (ECAFM), complemented by X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS). Potentiodynamic polarization initially identified the electrochemical behavior of TC4, delineating passive, dissolve, and second passivation regions. ECAFM enabled real-time, nanoscale observation of surface morphological evolution under controlled potentials. In the passive region (0.3–1.0 V), the passive film nucleated as nanoscale islands (<50 nm), which coalesced and expanded with increasing potential, consistent with classical nucleation-growth... (More)
This study systematically investigates the passivation and dissolution mechanisms of TC4 (Ti-6Al-4V) in 3.5 wt% NaCl solution using in situ electrochemical atomic force microscopy (ECAFM), complemented by X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS). Potentiodynamic polarization initially identified the electrochemical behavior of TC4, delineating passive, dissolve, and second passivation regions. ECAFM enabled real-time, nanoscale observation of surface morphological evolution under controlled potentials. In the passive region (0.3–1.0 V), the passive film nucleated as nanoscale islands (<50 nm), which coalesced and expanded with increasing potential, consistent with classical nucleation-growth models. Upon entering the dissolution region (1.5–1.8 V), these islands dissolved into interconnected flake-like structures, reflecting localized chloride-induced breakdown and transient current density fluctuations. In the second passivation region (2.0–3.0 V), the film regenerated via flake-mediated growth, achieving enhanced homogeneity and reduced roughness at 3.0 V, indicative of structural densification and defect healing. XPS and XAS analyses revealed critical insights into compositional and electronic structures. Titanium predominantly existed as Ti⁴⁺ (TiO₂) across all potentials, with minor Ti³⁺ contributions linked to metastable defects. The integration of ECAFM morphology, XPS composition, and XAS electronic structure data establishes a coherent passivation mechanism. This work advances the understanding of potential-dependent passivation dynamics in titanium alloys.
(Less)
- author
- organization
- publishing date
- 2025-10
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- ECAFM, In situ monitoring, Passivation, TC4 (Ti-6Al-4V), XAS
- in
- Corrosion Science
- volume
- 255
- article number
- 113102
- publisher
- Elsevier
- external identifiers
-
- scopus:105007416475
- ISSN
- 0010-938X
- DOI
- 10.1016/j.corsci.2025.113102
- language
- English
- LU publication?
- yes
- id
- 33a06d1d-6fbc-4df7-b4f2-9a7a22f916ff
- date added to LUP
- 2025-11-04 13:31:39
- date last changed
- 2025-11-04 13:32:57
@article{33a06d1d-6fbc-4df7-b4f2-9a7a22f916ff,
abstract = {{<p>This study systematically investigates the passivation and dissolution mechanisms of TC4 (Ti-6Al-4V) in 3.5 wt% NaCl solution using in situ electrochemical atomic force microscopy (ECAFM), complemented by X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS). Potentiodynamic polarization initially identified the electrochemical behavior of TC4, delineating passive, dissolve, and second passivation regions. ECAFM enabled real-time, nanoscale observation of surface morphological evolution under controlled potentials. In the passive region (0.3–1.0 V), the passive film nucleated as nanoscale islands (<50 nm), which coalesced and expanded with increasing potential, consistent with classical nucleation-growth models. Upon entering the dissolution region (1.5–1.8 V), these islands dissolved into interconnected flake-like structures, reflecting localized chloride-induced breakdown and transient current density fluctuations. In the second passivation region (2.0–3.0 V), the film regenerated via flake-mediated growth, achieving enhanced homogeneity and reduced roughness at 3.0 V, indicative of structural densification and defect healing. XPS and XAS analyses revealed critical insights into compositional and electronic structures. Titanium predominantly existed as Ti⁴⁺ (TiO₂) across all potentials, with minor Ti³⁺ contributions linked to metastable defects. The integration of ECAFM morphology, XPS composition, and XAS electronic structure data establishes a coherent passivation mechanism. This work advances the understanding of potential-dependent passivation dynamics in titanium alloys.</p>}},
author = {{Wang, Qingrui and Huang, Feifei and Chang, Hai and Wu, Jiangshun and Zhang, Hongbo and Wang, Wei and Zhu, Xinxin and Wang, Yeting and Tokushima, Takashi and Sun, Dongbai and Jin, Ying}},
issn = {{0010-938X}},
keywords = {{ECAFM; In situ monitoring; Passivation; TC4 (Ti-6Al-4V); XAS}},
language = {{eng}},
publisher = {{Elsevier}},
series = {{Corrosion Science}},
title = {{In situ passivation monitoring of Ti-6Al-4V in 3.5 wt% NaCl solution using ECAFM}},
url = {{http://dx.doi.org/10.1016/j.corsci.2025.113102}},
doi = {{10.1016/j.corsci.2025.113102}},
volume = {{255}},
year = {{2025}},
}
