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Material Characterization in Partially Filled Waveguides Using Inverse Scattering and Multiple Sample Orientations

Sjöberg, Daniel LU orcid and Larsson, Christer LU (2013) International Symposium on Electromagnetic Theory (EMTS URSI ) 2013 p.942-945
Abstract
We present a method aimed at reducing uncertainties and instabilities when characterizing materials in waveguide setups. The S-parameters for a rectangular waveguide loaded with a rectangular sample block are measured for three different sample orientations, and the corresponding geometries are modeled in a finite element program, taking any material parameters as input. The material parameters of the sample are found by minimizing the squared distance between measured and calculated S-parameters.
Please use this url to cite or link to this publication:
author
and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
[Host publication title missing]
pages
4 pages
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
conference name
International Symposium on Electromagnetic Theory (EMTS URSI ) 2013
conference location
Hiroshima, Japan
conference dates
2013-05-20 - 2013-05-23
external identifiers
  • wos:000327180500242
  • scopus:84883255814
ISSN
2163-405X
language
English
LU publication?
yes
id
b9c53f95-b0e9-4a4b-a0bf-3494d0c8038b (old id 3616478)
alternative location
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6565899
date added to LUP
2016-04-01 14:02:50
date last changed
2022-01-27 22:33:33
@inproceedings{b9c53f95-b0e9-4a4b-a0bf-3494d0c8038b,
  abstract     = {{We present a method aimed at reducing uncertainties and instabilities when characterizing materials in waveguide setups. The S-parameters for a rectangular waveguide loaded with a rectangular sample block are measured for three different sample orientations, and the corresponding geometries are modeled in a finite element program, taking any material parameters as input. The material parameters of the sample are found by minimizing the squared distance between measured and calculated S-parameters.}},
  author       = {{Sjöberg, Daniel and Larsson, Christer}},
  booktitle    = {{[Host publication title missing]}},
  issn         = {{2163-405X}},
  language     = {{eng}},
  pages        = {{942--945}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  title        = {{Material Characterization in Partially Filled Waveguides Using Inverse Scattering and Multiple Sample Orientations}},
  url          = {{http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6565899}},
  year         = {{2013}},
}