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Improved droplet elongation model and value for surface tension of AuSi

Andersen, Christopher R.Y. LU orcid and Mølhave, Kristian S. (2025) In CrystEngComm 27(15). p.2298-2306
Abstract

Surface tension is crucial for nanowire vapor liquid solid (VLS) growth models and simulations of growth under external stimuli. A promising method involving imaging droplet deformation under an external electric field has previously been used to report the surface tension of the AuSi eutectic catalyst on Si-nanowires. However, simplified assumptions in this approach led to a significantly lower value than those previously reported. In this study, we re-analyze the same dataset using a comprehensive three-dimensional (3D) model that accurately represents the hexagonal cross-section of Si nanowires. This approach provides a corrected surface tension value of 0.74 ± 0.26 J m−2 consistent with other findings in the literature,... (More)

Surface tension is crucial for nanowire vapor liquid solid (VLS) growth models and simulations of growth under external stimuli. A promising method involving imaging droplet deformation under an external electric field has previously been used to report the surface tension of the AuSi eutectic catalyst on Si-nanowires. However, simplified assumptions in this approach led to a significantly lower value than those previously reported. In this study, we re-analyze the same dataset using a comprehensive three-dimensional (3D) model that accurately represents the hexagonal cross-section of Si nanowires. This approach provides a corrected surface tension value of 0.74 ± 0.26 J m−2 consistent with other findings in the literature, and notably higher than the previously reported value of 0.55 ± 0.1 J m−2. Our result highlights the importance of precise geometric modeling in accurately determining surface tension and enhancing the reliability of nanowire growth simulations and eutectic alloy studies.

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author
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publishing date
type
Contribution to journal
publication status
published
subject
in
CrystEngComm
volume
27
issue
15
pages
9 pages
publisher
Royal Society of Chemistry
external identifiers
  • scopus:105003043964
ISSN
1466-8033
DOI
10.1039/d4ce01144a
language
English
LU publication?
yes
additional info
Publisher Copyright: © 2025 The Royal Society of Chemistry.
id
5174fbb6-648e-4382-bc1d-30f847cf72dd
date added to LUP
2025-12-05 14:55:23
date last changed
2025-12-05 14:56:31
@article{5174fbb6-648e-4382-bc1d-30f847cf72dd,
  abstract     = {{<p>Surface tension is crucial for nanowire vapor liquid solid (VLS) growth models and simulations of growth under external stimuli. A promising method involving imaging droplet deformation under an external electric field has previously been used to report the surface tension of the AuSi eutectic catalyst on Si-nanowires. However, simplified assumptions in this approach led to a significantly lower value than those previously reported. In this study, we re-analyze the same dataset using a comprehensive three-dimensional (3D) model that accurately represents the hexagonal cross-section of Si nanowires. This approach provides a corrected surface tension value of 0.74 ± 0.26 J m<sup>−2</sup> consistent with other findings in the literature, and notably higher than the previously reported value of 0.55 ± 0.1 J m<sup>−2</sup>. Our result highlights the importance of precise geometric modeling in accurately determining surface tension and enhancing the reliability of nanowire growth simulations and eutectic alloy studies.</p>}},
  author       = {{Andersen, Christopher R.Y. and Mølhave, Kristian S.}},
  issn         = {{1466-8033}},
  language     = {{eng}},
  month        = {{02}},
  number       = {{15}},
  pages        = {{2298--2306}},
  publisher    = {{Royal Society of Chemistry}},
  series       = {{CrystEngComm}},
  title        = {{Improved droplet elongation model and value for surface tension of AuSi}},
  url          = {{http://dx.doi.org/10.1039/d4ce01144a}},
  doi          = {{10.1039/d4ce01144a}},
  volume       = {{27}},
  year         = {{2025}},
}