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Non-binary phase gratings for x-ray imaging with a compact Talbot interferometer

Yaroshenko, Andre ; Bech, Martin LU orcid ; Potdevin, Guillaume ; Malecki, Andreas ; Biernath, Thomas ; Wolf, Johannes ; Tapfer, Arne ; Schüttler, Markus ; Meiser, Jan and Kunka, Danays , et al. (2014) In Optics Express 22(1). p.56-547
Abstract

X-ray imaging using a Talbot-Lau interferometer, consisting of three binary gratings, is a well-established approach to acquire x-ray phase-contrast and dark-field images with a polychromatic source. However, challenges in the production of high aspect ratio gratings limit the construction of a compact setup for high x-ray energies. In this study we consider the use of phase gratings with triangular-shaped structures in an x-ray interferometer and show that such gratings can yield high visibilities for significantly shorter propagation distances than conventional gratings with binary structures. The findings are supported by simulation and experimental results for both cases of a monochromatic and a polychromatic source.

Please use this url to cite or link to this publication:
@article{6a833b13-7b95-4a9d-ae83-f67d48033241,
  abstract     = {{<p>X-ray imaging using a Talbot-Lau interferometer, consisting of three binary gratings, is a well-established approach to acquire x-ray phase-contrast and dark-field images with a polychromatic source. However, challenges in the production of high aspect ratio gratings limit the construction of a compact setup for high x-ray energies. In this study we consider the use of phase gratings with triangular-shaped structures in an x-ray interferometer and show that such gratings can yield high visibilities for significantly shorter propagation distances than conventional gratings with binary structures. The findings are supported by simulation and experimental results for both cases of a monochromatic and a polychromatic source. </p>}},
  author       = {{Yaroshenko, Andre and Bech, Martin and Potdevin, Guillaume and Malecki, Andreas and Biernath, Thomas and Wolf, Johannes and Tapfer, Arne and Schüttler, Markus and Meiser, Jan and Kunka, Danays and Amberger, Maximilian and Mohr, Juergen and Pfeiffer, Franz}},
  issn         = {{1094-4087}},
  keywords     = {{Computer Simulation; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Interferometry/instrumentation; Lighting/instrumentation; Models, Theoretical; Refractometry/instrumentation; X-Ray Diffraction/instrumentation}},
  language     = {{eng}},
  month        = {{01}},
  number       = {{1}},
  pages        = {{56--547}},
  publisher    = {{Optical Society of America}},
  series       = {{Optics Express}},
  title        = {{Non-binary phase gratings for x-ray imaging with a compact Talbot interferometer}},
  url          = {{http://dx.doi.org/10.1364/OE.22.000547}},
  doi          = {{10.1364/OE.22.000547}},
  volume       = {{22}},
  year         = {{2014}},
}