BETSEE : testing for system-wide effects of single event effects on ITk strip modules
(2023) In Journal of Instrumentation 18(1).- Abstract
The Inner Tracker silicon strip detector (ITk Strip) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event Errors. Their resilience at the system-level can be tested using the Board for Evaluation of Triple-chip Single Event Effects (BETSEE). This special board places all three ASICs into the beam-spot of a test beam facility concurrently and allows for module-like operation. The results from irradiating BETSEE with heavy ions and protons will be presented.
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- author
- organization
- publishing date
- 2023-01-01
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- Digital electronic circuits, Front-end electronics for detector readout, Radiation-hard detectors
- in
- Journal of Instrumentation
- volume
- 18
- issue
- 1
- article number
- C01019
- publisher
- IOP Publishing
- external identifiers
-
- scopus:85146491173
- ISSN
- 1748-0221
- DOI
- 10.1088/1748-0221/18/01/C01019
- language
- English
- LU publication?
- yes
- id
- 710c7041-7a6c-4b47-9e65-a24650683a42
- date added to LUP
- 2024-01-12 12:25:17
- date last changed
- 2024-01-12 12:27:21
@article{710c7041-7a6c-4b47-9e65-a24650683a42, abstract = {{<p>The Inner Tracker silicon strip detector (ITk Strip) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event Errors. Their resilience at the system-level can be tested using the Board for Evaluation of Triple-chip Single Event Effects (BETSEE). This special board places all three ASICs into the beam-spot of a test beam facility concurrently and allows for module-like operation. The results from irradiating BETSEE with heavy ions and protons will be presented.</p>}}, author = {{Belanger-Champagne, C. and Dandoy, J. and Gallop, B. and Gosart, T. and Helling, C. and Keener, P. and Krizka, K. and McGovern, B. and Mullier, G. and Poley, A. L. and Roberts, B. and Sawyer, C. and Wall, A. and Wang, H. and Warren, M.}}, issn = {{1748-0221}}, keywords = {{Digital electronic circuits; Front-end electronics for detector readout; Radiation-hard detectors}}, language = {{eng}}, month = {{01}}, number = {{1}}, publisher = {{IOP Publishing}}, series = {{Journal of Instrumentation}}, title = {{BETSEE : testing for system-wide effects of single event effects on ITk strip modules}}, url = {{http://dx.doi.org/10.1088/1748-0221/18/01/C01019}}, doi = {{10.1088/1748-0221/18/01/C01019}}, volume = {{18}}, year = {{2023}}, }