Spectrally resolved x-ray beam induced current in a single InGaP nanowire
(2018) In Nanotechnology 29(45).- Abstract
We demonstrate x-ray absorption fine structure spectroscopy (XAFS) detected by x-ray beam induced current (XBIC) in single n + -i-n + doped nanowire devices. Spatial scans with the 65 nm diameter beam show a peak of the XBIC signal in the middle segment of the nanowire. The XBIC and the x-ray fluorescence signals were detected simultaneously as a function of the excitation energy near the Ga K absorption edge at 10.37 keV. The spectra show similar oscillations around the edge, which shows that the XBIC is limited by the primary absorption. Our results reveal the feasibility of the XBIC detection mode for the XAFS investigation in nanostructured devices.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/8449d963-6ae1-43cb-8220-eb24433d3b79
- author
- Chayanun, Lert LU ; Dagyte, Vilgaile LU ; Troian, Andrea LU ; Salomon, Damien ; Borgström, Magnus LU and Wallentin, Jesper LU
- organization
- publishing date
- 2018-09-10
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- nanowire, x-ray absorption fine structure spectroscopy (XAFS), x-ray beam induced current (XBIC)
- in
- Nanotechnology
- volume
- 29
- issue
- 45
- article number
- 454001
- publisher
- IOP Publishing
- external identifiers
-
- pmid:30136654
- scopus:85053410087
- ISSN
- 0957-4484
- DOI
- 10.1088/1361-6528/aadc76
- language
- English
- LU publication?
- yes
- id
- 8449d963-6ae1-43cb-8220-eb24433d3b79
- date added to LUP
- 2018-10-11 08:37:10
- date last changed
- 2024-09-17 04:48:25
@article{8449d963-6ae1-43cb-8220-eb24433d3b79, abstract = {{<p>We demonstrate x-ray absorption fine structure spectroscopy (XAFS) detected by x-ray beam induced current (XBIC) in single n <sup>+</sup> -i-n <sup>+</sup> doped nanowire devices. Spatial scans with the 65 nm diameter beam show a peak of the XBIC signal in the middle segment of the nanowire. The XBIC and the x-ray fluorescence signals were detected simultaneously as a function of the excitation energy near the Ga K absorption edge at 10.37 keV. The spectra show similar oscillations around the edge, which shows that the XBIC is limited by the primary absorption. Our results reveal the feasibility of the XBIC detection mode for the XAFS investigation in nanostructured devices.</p>}}, author = {{Chayanun, Lert and Dagyte, Vilgaile and Troian, Andrea and Salomon, Damien and Borgström, Magnus and Wallentin, Jesper}}, issn = {{0957-4484}}, keywords = {{nanowire; x-ray absorption fine structure spectroscopy (XAFS); x-ray beam induced current (XBIC)}}, language = {{eng}}, month = {{09}}, number = {{45}}, publisher = {{IOP Publishing}}, series = {{Nanotechnology}}, title = {{Spectrally resolved x-ray beam induced current in a single InGaP nanowire}}, url = {{http://dx.doi.org/10.1088/1361-6528/aadc76}}, doi = {{10.1088/1361-6528/aadc76}}, volume = {{29}}, year = {{2018}}, }