In Operando X-Ray Nanodiffraction Reveals Electrically Induced Bending and Lattice Contraction in a Single Nanowire Device
(2016) In Advanced Materials 28(9). p.1788-1792- Abstract
Hard X-ray diffraction (XRD) using a nanofocused beam is used to measure both lattice contraction and bending in a single nanowire device under electric bias. The shape of the nanowire is reconstructed in 3D with sub-nanometer precision. As the bias voltage is gradually increased, nonreversible structural changes in the contact regions are observed, correlated with degradation of the electrical conductance.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/86e962bb-eba0-40a5-a093-d33098ba562f
- author
- Wallentin, Jesper LU ; Osterhoff, Markus and Salditt, Tim
- publishing date
- 2016-03-02
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- lattice contraction, single nanowire devices, X-ray nanodiffraction
- in
- Advanced Materials
- volume
- 28
- issue
- 9
- pages
- 5 pages
- publisher
- John Wiley & Sons Inc.
- external identifiers
-
- scopus:84959542517
- ISSN
- 0935-9648
- DOI
- 10.1002/adma.201504188
- language
- English
- LU publication?
- no
- id
- 86e962bb-eba0-40a5-a093-d33098ba562f
- date added to LUP
- 2017-12-13 16:23:34
- date last changed
- 2022-02-07 17:32:47
@article{86e962bb-eba0-40a5-a093-d33098ba562f, abstract = {{<p>Hard X-ray diffraction (XRD) using a nanofocused beam is used to measure both lattice contraction and bending in a single nanowire device under electric bias. The shape of the nanowire is reconstructed in 3D with sub-nanometer precision. As the bias voltage is gradually increased, nonreversible structural changes in the contact regions are observed, correlated with degradation of the electrical conductance.</p>}}, author = {{Wallentin, Jesper and Osterhoff, Markus and Salditt, Tim}}, issn = {{0935-9648}}, keywords = {{lattice contraction; single nanowire devices; X-ray nanodiffraction}}, language = {{eng}}, month = {{03}}, number = {{9}}, pages = {{1788--1792}}, publisher = {{John Wiley & Sons Inc.}}, series = {{Advanced Materials}}, title = {{In Operando X-Ray Nanodiffraction Reveals Electrically Induced Bending and Lattice Contraction in a Single Nanowire Device}}, url = {{http://dx.doi.org/10.1002/adma.201504188}}, doi = {{10.1002/adma.201504188}}, volume = {{28}}, year = {{2016}}, }