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Thickness dependence of photoemission and X-ray fluorescence spectra in epitaxial NiO layers on Ag(100)

Krasnikov, S. A. ; Preobrajenski, Alexei LU ; Chasse, T. and Szargan, R. (2003) In Thin Solid Films 428. p.201-205
Please use this url to cite or link to this publication:
author
; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Thin Solid Films
volume
428
pages
201 - 205
publisher
Elsevier
external identifiers
  • scopus:0037457163
ISSN
0040-6090
language
English
LU publication?
yes
id
e1c5484e-2188-43fa-92a8-c9a6e4aa95c4 (old id 976208)
date added to LUP
2016-04-04 13:31:10
date last changed
2022-01-30 00:24:27
@article{e1c5484e-2188-43fa-92a8-c9a6e4aa95c4,
  author       = {{Krasnikov, S. A. and Preobrajenski, Alexei and Chasse, T. and Szargan, R.}},
  issn         = {{0040-6090}},
  language     = {{eng}},
  pages        = {{201--205}},
  publisher    = {{Elsevier}},
  series       = {{Thin Solid Films}},
  title        = {{Thickness dependence of photoemission and X-ray fluorescence spectra in epitaxial NiO layers on Ag(100)}},
  volume       = {{428}},
  year         = {{2003}},
}