Evolution of non-ionic surfactant-templated silicate films at the air-liquid interface
(2008) In Journal of Materials Chemistry 18(11). p.1222-1231- Abstract
Spontaneous growth of non-ionic surfactant-templated thin films at the air-water interface was investigated using three techniques: Brewster angle microscopy (BAM), time-resolved off-specular X-ray reflectivity and grazing incidence X-ray diffraction (GIXD). Experiments were also carried out to study the evolution of micelles in the subphase solution using small-angle neutron scattering (SANS). Films were prepared in acidic conditions using octaethylene glycol mono-n-hexadecyl ether (C16EO8) as the surfactant and tetramethyloxysilane (TMOS) as the silica precursor. Three different TMOS-C16EO8 molar ratios (3.5, 7.1 and 10.8) were studied. Variation of the silica-precursor concentration causes... (More)
Spontaneous growth of non-ionic surfactant-templated thin films at the air-water interface was investigated using three techniques: Brewster angle microscopy (BAM), time-resolved off-specular X-ray reflectivity and grazing incidence X-ray diffraction (GIXD). Experiments were also carried out to study the evolution of micelles in the subphase solution using small-angle neutron scattering (SANS). Films were prepared in acidic conditions using octaethylene glycol mono-n-hexadecyl ether (C16EO8) as the surfactant and tetramethyloxysilane (TMOS) as the silica precursor. Three different TMOS-C16EO8 molar ratios (3.5, 7.1 and 10.8) were studied. Variation of the silica-precursor concentration causes a significant effect on the film-formation time, the solution and film-growth mechanisms and the final film structure.
(Less)
- author
- Fernandez-Martin, Cristina ; Roser, Stephen J. and Edler, Karen J. LU
- publishing date
- 2008
- type
- Contribution to journal
- publication status
- published
- in
- Journal of Materials Chemistry
- volume
- 18
- issue
- 11
- pages
- 10 pages
- publisher
- Royal Society of Chemistry
- external identifiers
-
- scopus:40449137446
- ISSN
- 0959-9428
- DOI
- 10.1039/b716662a
- language
- English
- LU publication?
- no
- id
- bc8134f8-abf7-40f9-b17b-e4ab2e3b0f68
- date added to LUP
- 2023-05-04 18:10:29
- date last changed
- 2023-06-13 08:32:48
@article{bc8134f8-abf7-40f9-b17b-e4ab2e3b0f68, abstract = {{<p>Spontaneous growth of non-ionic surfactant-templated thin films at the air-water interface was investigated using three techniques: Brewster angle microscopy (BAM), time-resolved off-specular X-ray reflectivity and grazing incidence X-ray diffraction (GIXD). Experiments were also carried out to study the evolution of micelles in the subphase solution using small-angle neutron scattering (SANS). Films were prepared in acidic conditions using octaethylene glycol mono-n-hexadecyl ether (C<sub>16</sub>EO<sub>8</sub>) as the surfactant and tetramethyloxysilane (TMOS) as the silica precursor. Three different TMOS-C<sub>16</sub>EO<sub>8</sub> molar ratios (3.5, 7.1 and 10.8) were studied. Variation of the silica-precursor concentration causes a significant effect on the film-formation time, the solution and film-growth mechanisms and the final film structure.</p>}}, author = {{Fernandez-Martin, Cristina and Roser, Stephen J. and Edler, Karen J.}}, issn = {{0959-9428}}, language = {{eng}}, number = {{11}}, pages = {{1222--1231}}, publisher = {{Royal Society of Chemistry}}, series = {{Journal of Materials Chemistry}}, title = {{Evolution of non-ionic surfactant-templated silicate films at the air-liquid interface}}, url = {{http://dx.doi.org/10.1039/b716662a}}, doi = {{10.1039/b716662a}}, volume = {{18}}, year = {{2008}}, }