Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources
(2019) In Optica 6(9). p.1106-1109- Abstract
Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per... (More)
Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources.
(Less)
- author
- organization
- publishing date
- 2019-01-01
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Optica
- volume
- 6
- issue
- 9
- pages
- 4 pages
- publisher
- Optical Society of America
- external identifiers
-
- scopus:85073317998
- ISSN
- 2334-2536
- DOI
- 10.1364/OPTICA.6.001106
- language
- English
- LU publication?
- yes
- id
- d58ea7b0-9af5-436e-8c31-a520f21c575c
- date added to LUP
- 2019-12-19 11:16:14
- date last changed
- 2023-11-19 21:17:26
@article{d58ea7b0-9af5-436e-8c31-a520f21c575c, abstract = {{<p>Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources.</p>}}, author = {{Vagovič, Patrik and Sato, Tokushi and Mikeš, Ladislav and Mills, Grant and Graceffa, Rita and Mattsson, Frans and Villanueva-Perez, Pablo and Ershov, Alexey and Faragó, Tomáš and Uličný, Jozef and Kirkwood, Henry and Letrun, Romain and Mokso, Rajmund and Zdora, Marie Christine and Olbinado, Margie P. and Rack, Alexander and Baumbach, Tilo and Schulz, Joachim and Meents, Alke and Chapman, Henry N. and Mancuso, Adrian P.}}, issn = {{2334-2536}}, language = {{eng}}, month = {{01}}, number = {{9}}, pages = {{1106--1109}}, publisher = {{Optical Society of America}}, series = {{Optica}}, title = {{Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources}}, url = {{http://dx.doi.org/10.1364/OPTICA.6.001106}}, doi = {{10.1364/OPTICA.6.001106}}, volume = {{6}}, year = {{2019}}, }