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Defect Content Estimations from Review Data

Wohlin, Claes LU and Runeson, Per LU orcid (1998) 20th International Conference on Software Engineering (ICSE) p.400-409
Abstract
Reviews are essential for defect detection and they provide an opportunity to control the software development process. This paper focuses upon methods for estimating the defect content after a review and hence to provide support for process control. Two new estimation methods are introduced as the assumptions of the existing statistical methods are not fulfilled. The new methods are compared with a maximum-likelihood approach. Data from several reviews are used to evaluate the different methods. It is concluded that the new estimation methods provide new opportunities to estimate the defect content.
Please use this url to cite or link to this publication:
author
and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
Proceedings of the 20th International Conference on Software Engineering
pages
10 pages
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
conference name
20th International Conference on Software Engineering (ICSE)
conference location
Kyoto, Japan
conference dates
1998-04-19 - 1998-04-25
external identifiers
  • scopus:0031597184
ISBN
0-8186-8368-6
DOI
10.1109/ICSE.1998.671393
language
English
LU publication?
yes
id
ecdabe1d-b126-40f4-be11-3cb9d2e047ab
date added to LUP
2019-03-28 20:28:52
date last changed
2022-02-15 17:32:23
@inproceedings{ecdabe1d-b126-40f4-be11-3cb9d2e047ab,
  abstract     = {{Reviews are essential for defect detection and they provide an opportunity to control the software development process. This paper focuses upon methods for estimating the defect content after a review and hence to provide support for process control. Two new estimation methods are introduced as the assumptions of the existing statistical methods are not fulfilled. The new methods are compared with a maximum-likelihood approach. Data from several reviews are used to evaluate the different methods. It is concluded that the new estimation methods provide new opportunities to estimate the defect content.}},
  author       = {{Wohlin, Claes and Runeson, Per}},
  booktitle    = {{Proceedings of the 20th International Conference on Software Engineering}},
  isbn         = {{0-8186-8368-6}},
  language     = {{eng}},
  pages        = {{400--409}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  title        = {{Defect Content Estimations from Review Data}},
  url          = {{http://dx.doi.org/10.1109/ICSE.1998.671393}},
  doi          = {{10.1109/ICSE.1998.671393}},
  year         = {{1998}},
}