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AFM-based manipulation of InAs nanowires

Conache, Gabriela LU ; Gray, Struan LU ; Bordag, M. ; Ribayrol, Aline LU ; Fröberg, Linus LU ; Samuelson, Lars LU ; Pettersson, H and Montelius, Lars LU (2008) 17th International Vacuum Congress/13th International Conference on Surface Science/Internatinal Conference on Nanoscience and Technology 100. p.052051-052051
Abstract
A controlled method of manipulation of nanowires was found using the tip of an Atomic Force Microscope (AFM). Manipulation is done in the 'Retrace Lift' mode, where feedback is turned off for the reverse scan and the tip follows a nominal path. The effective manipulation force during the reverse scan can be changed by varying an offset in the height of the tip over the surface. Using this method, we have studied InAs nanowires on different substrates. We have also investigated interactions between wires and with gold features patterned onto the substrates.
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author
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organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
Journal of Physics: Conference Series
volume
100
pages
052051 - 052051
publisher
IOP Publishing
conference name
17th International Vacuum Congress/13th International Conference on Surface Science/Internatinal Conference on Nanoscience and Technology
conference location
Stockholm, Sweden
conference dates
2007-07-02 - 2007-07-06
external identifiers
  • wos:000275655200147
  • scopus:77954338849
ISSN
1742-6588
1742-6596
DOI
10.1088/1742-6596/100/5/052051
language
English
LU publication?
yes
id
0c58260e-f98a-4d14-ba15-76e0008fb782 (old id 1586325)
date added to LUP
2016-04-01 12:35:47
date last changed
2020-02-19 02:07:13
@inproceedings{0c58260e-f98a-4d14-ba15-76e0008fb782,
  abstract     = {A controlled method of manipulation of nanowires was found using the tip of an Atomic Force Microscope (AFM). Manipulation is done in the 'Retrace Lift' mode, where feedback is turned off for the reverse scan and the tip follows a nominal path. The effective manipulation force during the reverse scan can be changed by varying an offset in the height of the tip over the surface. Using this method, we have studied InAs nanowires on different substrates. We have also investigated interactions between wires and with gold features patterned onto the substrates.},
  author       = {Conache, Gabriela and Gray, Struan and Bordag, M. and Ribayrol, Aline and Fröberg, Linus and Samuelson, Lars and Pettersson, H and Montelius, Lars},
  booktitle    = {Journal of Physics: Conference Series},
  issn         = {1742-6588},
  language     = {eng},
  pages        = {052051--052051},
  publisher    = {IOP Publishing},
  title        = {AFM-based manipulation of InAs nanowires},
  url          = {http://dx.doi.org/10.1088/1742-6596/100/5/052051},
  doi          = {10.1088/1742-6596/100/5/052051},
  volume       = {100},
  year         = {2008},
}