Reference shape effects on Fourier transform holography
(2022) In Optics Express 30(21). p.38424-38438- Abstract
Soft-x-ray holography which utilizes an optics mask fabricated in direct contact with the sample, is a widely applied x-ray microscopy method, in particular, for investigating magnetic samples. The optics mask splits the x-ray beam into a reference wave and a wave to illuminate the sample. The reconstruction quality in such a Fourier-transform holography experiment depends primarily on the characteristics of the reference wave, typically emerging from a small, high-aspect-ratio pinhole in the mask. In this paper, we study two commonly used reference geometries and investigate how their 3D structure affects the reconstruction within an x-ray Fourier holography experiment. Insight into these effects is obtained by imaging the exit waves... (More)
Soft-x-ray holography which utilizes an optics mask fabricated in direct contact with the sample, is a widely applied x-ray microscopy method, in particular, for investigating magnetic samples. The optics mask splits the x-ray beam into a reference wave and a wave to illuminate the sample. The reconstruction quality in such a Fourier-transform holography experiment depends primarily on the characteristics of the reference wave, typically emerging from a small, high-aspect-ratio pinhole in the mask. In this paper, we study two commonly used reference geometries and investigate how their 3D structure affects the reconstruction within an x-ray Fourier holography experiment. Insight into these effects is obtained by imaging the exit waves from reference pinholes via high-resolution coherent diffraction imaging combined with three-dimensional multislice simulations of the x-ray propagation through the reference pinhole. The results were used to simulate Fourier-transform holography experiments to determine the spatial resolution and precise location of the reconstruction plane for different reference geometries. Based on our findings, we discuss the properties of the reference pinholes with view on application in soft-x-ray holography experiments.
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- author
- Malm, Erik LU ; Pfau, Bastian LU ; Schneider, Michael ; Günther, Christian M. ; Hessing, Piet ; Büttner, Felix ; Mikkelsen, Anders LU and Eisebitt, Stefan LU
- organization
- publishing date
- 2022-10-10
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Optics Express
- volume
- 30
- issue
- 21
- pages
- 15 pages
- publisher
- Optical Society of America
- external identifiers
-
- pmid:36258408
- scopus:85139409867
- ISSN
- 1094-4087
- DOI
- 10.1364/OE.463338
- language
- English
- LU publication?
- yes
- id
- 0c9c6695-7ecf-4553-a590-a7008e9fad1d
- date added to LUP
- 2022-12-13 16:19:34
- date last changed
- 2024-05-30 20:46:03
@article{0c9c6695-7ecf-4553-a590-a7008e9fad1d,
abstract = {{<p>Soft-x-ray holography which utilizes an optics mask fabricated in direct contact with the sample, is a widely applied x-ray microscopy method, in particular, for investigating magnetic samples. The optics mask splits the x-ray beam into a reference wave and a wave to illuminate the sample. The reconstruction quality in such a Fourier-transform holography experiment depends primarily on the characteristics of the reference wave, typically emerging from a small, high-aspect-ratio pinhole in the mask. In this paper, we study two commonly used reference geometries and investigate how their 3D structure affects the reconstruction within an x-ray Fourier holography experiment. Insight into these effects is obtained by imaging the exit waves from reference pinholes via high-resolution coherent diffraction imaging combined with three-dimensional multislice simulations of the x-ray propagation through the reference pinhole. The results were used to simulate Fourier-transform holography experiments to determine the spatial resolution and precise location of the reconstruction plane for different reference geometries. Based on our findings, we discuss the properties of the reference pinholes with view on application in soft-x-ray holography experiments.</p>}},
author = {{Malm, Erik and Pfau, Bastian and Schneider, Michael and Günther, Christian M. and Hessing, Piet and Büttner, Felix and Mikkelsen, Anders and Eisebitt, Stefan}},
issn = {{1094-4087}},
language = {{eng}},
month = {{10}},
number = {{21}},
pages = {{38424--38438}},
publisher = {{Optical Society of America}},
series = {{Optics Express}},
title = {{Reference shape effects on Fourier transform holography}},
url = {{http://dx.doi.org/10.1364/OE.463338}},
doi = {{10.1364/OE.463338}},
volume = {{30}},
year = {{2022}},
}