Detailed behavioral modeling of bang-bang phase detectors
(2006) p.716-719- Abstract
- In this paper, the metastability of current-mode logic (CML) latches and flip-flops is studied in detail. Based on the results of this analysis, a behavioral model of bang-bang phase detectors (BBPDs) is proposed, which is able to reliably capture the critical deadzone effect. The impact of jitter and of process, voltage and temperature variations on the BBPD behavior is also investigated. The proposed model can be used with advantage in the high-level design and verification of e.g. clock and data recovery (CDR) circuits
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/1051003
- author
- Jiang, Chenhui ; Andreani, Pietro LU and Keil, Ulrich
- publishing date
- 2006
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2006.
- pages
- 716 - 719
- external identifiers
-
- scopus:50249188319
- ISBN
- 1-4244-0387-1
- DOI
- 10.1109/APCCAS.2006.342108
- language
- English
- LU publication?
- no
- id
- 701ecd79-3398-442e-912e-2a0796e19509 (old id 1051003)
- alternative location
- http://ieeexplore.ieee.org/iel5/4145316/4118066/04145493.pdf?tp=&isnumber=4118066&arnumber=4145493&punumber=4145316
- date added to LUP
- 2016-04-04 12:52:09
- date last changed
- 2022-01-29 23:30:21
@inproceedings{701ecd79-3398-442e-912e-2a0796e19509, abstract = {{In this paper, the metastability of current-mode logic (CML) latches and flip-flops is studied in detail. Based on the results of this analysis, a behavioral model of bang-bang phase detectors (BBPDs) is proposed, which is able to reliably capture the critical deadzone effect. The impact of jitter and of process, voltage and temperature variations on the BBPD behavior is also investigated. The proposed model can be used with advantage in the high-level design and verification of e.g. clock and data recovery (CDR) circuits}}, author = {{Jiang, Chenhui and Andreani, Pietro and Keil, Ulrich}}, booktitle = {{IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2006.}}, isbn = {{1-4244-0387-1}}, language = {{eng}}, pages = {{716--719}}, title = {{Detailed behavioral modeling of bang-bang phase detectors}}, url = {{http://dx.doi.org/10.1109/APCCAS.2006.342108}}, doi = {{10.1109/APCCAS.2006.342108}}, year = {{2006}}, }