Advanced

Detailed behavioral modeling of bang-bang phase detectors

Jiang, Chenhui; Andreani, Pietro LU and Keil, Ulrich (2006) In IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2006. p.716-719
Abstract
In this paper, the metastability of current-mode logic (CML) latches and flip-flops is studied in detail. Based on the results of this analysis, a behavioral model of bang-bang phase detectors (BBPDs) is proposed, which is able to reliably capture the critical deadzone effect. The impact of jitter and of process, voltage and temperature variations on the BBPD behavior is also investigated. The proposed model can be used with advantage in the high-level design and verification of e.g. clock and data recovery (CDR) circuits
Please use this url to cite or link to this publication:
author
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
in
IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2006.
pages
716 - 719
external identifiers
  • scopus:50249188319
ISBN
1-4244-0387-1
DOI
10.1109/APCCAS.2006.342108
language
English
LU publication?
no
id
701ecd79-3398-442e-912e-2a0796e19509 (old id 1051003)
alternative location
http://ieeexplore.ieee.org/iel5/4145316/4118066/04145493.pdf?tp=&isnumber=4118066&arnumber=4145493&punumber=4145316
date added to LUP
2008-03-27 15:37:13
date last changed
2017-01-01 08:08:57
@inproceedings{701ecd79-3398-442e-912e-2a0796e19509,
  abstract     = {In this paper, the metastability of current-mode logic (CML) latches and flip-flops is studied in detail. Based on the results of this analysis, a behavioral model of bang-bang phase detectors (BBPDs) is proposed, which is able to reliably capture the critical deadzone effect. The impact of jitter and of process, voltage and temperature variations on the BBPD behavior is also investigated. The proposed model can be used with advantage in the high-level design and verification of e.g. clock and data recovery (CDR) circuits},
  author       = {Jiang, Chenhui and Andreani, Pietro and Keil, Ulrich},
  booktitle    = {IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2006.},
  isbn         = {1-4244-0387-1},
  language     = {eng},
  pages        = {716--719},
  title        = {Detailed behavioral modeling of bang-bang phase detectors},
  url          = {http://dx.doi.org/10.1109/APCCAS.2006.342108},
  year         = {2006},
}