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200 and 300 MeV/nucleon nuclear reactions responsible for single-event effects in microelectronics

Jaderstrom, H.; Murin, Yu.; Babain, Yu.; Chubarov, M.; Pljuschev, V.; Zubkov, M.; Nomokonov, P.; Olsson, N.; Blomgren, J. and Tippawan, U., et al. (2008) In Physical Review C (Nuclear Physics) 77(4).
Abstract
An experimental study of nuclear reactions between Si-28 nuclei at 200 and 300 MeV/nucleon and hydrogen or deuterium target nuclei was performed at the CELSIUS storage ring in Uppsala, Sweden, to collect information about the reactions responsible for single-event effects in microelectronics. Inclusive data on Si-28 fragmentation, as well as data on correlations between recoils and spectator protons or alpha particles are compared to predictions from the Dubna cascade model and the Japan Atomic Energy Research Institute version of the quantum molecular dynamics model. The comparison shows satisfactory agreement for inclusive data except for He fragments where low-energy sub-barrier fragments and recoiling fragments with very large momenta... (More)
An experimental study of nuclear reactions between Si-28 nuclei at 200 and 300 MeV/nucleon and hydrogen or deuterium target nuclei was performed at the CELSIUS storage ring in Uppsala, Sweden, to collect information about the reactions responsible for single-event effects in microelectronics. Inclusive data on Si-28 fragmentation, as well as data on correlations between recoils and spectator protons or alpha particles are compared to predictions from the Dubna cascade model and the Japan Atomic Energy Research Institute version of the quantum molecular dynamics model. The comparison shows satisfactory agreement for inclusive data except for He fragments where low-energy sub-barrier fragments and recoiling fragments with very large momenta are produced much more frequently than predicted. The yield of exclusive data are also severely underestimated by the models whereas the charge distributions of recoils in these correlations compare well. The observed enhancement in He emission, which may well be important for the description of single-event effects, is most likely to be attributed to alpha clustering in Si-28 nuclei. (Less)
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publication status
published
subject
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Physical Review C (Nuclear Physics)
volume
77
issue
4
publisher
American Physical Society
external identifiers
  • wos:000255457700034
  • scopus:41849103417
ISSN
0556-2813
DOI
10.1103/PhysRevC.77.044601
language
English
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yes
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5353da07-65ed-4fd4-b4ec-a63102b73721 (old id 1205042)
date added to LUP
2008-09-18 13:15:22
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2017-01-01 05:25:36
@article{5353da07-65ed-4fd4-b4ec-a63102b73721,
  abstract     = {An experimental study of nuclear reactions between Si-28 nuclei at 200 and 300 MeV/nucleon and hydrogen or deuterium target nuclei was performed at the CELSIUS storage ring in Uppsala, Sweden, to collect information about the reactions responsible for single-event effects in microelectronics. Inclusive data on Si-28 fragmentation, as well as data on correlations between recoils and spectator protons or alpha particles are compared to predictions from the Dubna cascade model and the Japan Atomic Energy Research Institute version of the quantum molecular dynamics model. The comparison shows satisfactory agreement for inclusive data except for He fragments where low-energy sub-barrier fragments and recoiling fragments with very large momenta are produced much more frequently than predicted. The yield of exclusive data are also severely underestimated by the models whereas the charge distributions of recoils in these correlations compare well. The observed enhancement in He emission, which may well be important for the description of single-event effects, is most likely to be attributed to alpha clustering in Si-28 nuclei.},
  articleno    = {044601},
  author       = {Jaderstrom, H. and Murin, Yu. and Babain, Yu. and Chubarov, M. and Pljuschev, V. and Zubkov, M. and Nomokonov, P. and Olsson, N. and Blomgren, J. and Tippawan, U. and Westerberg, L. and Golubev, Pavel and Jakobsson, Bo and Geren, L. and Tegner, P. -E. and Zartova, I. and Budzanowski, A. and Czech, B. and Skwirczynska, I. and Kondratiev, V. and Tang, H. H. K. and Aichelin, J. and Watanabe, Y. and Gudima, K. K.},
  issn         = {0556-2813},
  language     = {eng},
  number       = {4},
  publisher    = {American Physical Society},
  series       = {Physical Review C (Nuclear Physics)},
  title        = {200 and 300 MeV/nucleon nuclear reactions responsible for single-event effects in microelectronics},
  url          = {http://dx.doi.org/10.1103/PhysRevC.77.044601},
  volume       = {77},
  year         = {2008},
}