Arithmetic reduction of adder leakage in nanoscale CMOS
(2008) The 2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS 2008) p.717-720- Abstract
- in today’s technology generations, e.g. 90 and 65 nm, the static power consumption becomes a major contributor to the total power consumption. It is therefore important to consider all abstraction levels to reduce this power. This paper focuses on the arithmetic level and shows a methodology for a substantial reduction of the static power consumption. Both the dynamic and static power consumption is evaluated for bit-parallel and bit-serial arithmetic. Simulations are done in a typical 130 nm technology. With only a minor cost in dynamic power consumption, a static power reduction up to 13 times is shown by using bit-serial arithmetic.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/1212783
- author
- Nilsson, Peter LU
- organization
- publishing date
- 2008
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- 2008 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS 2008), VOLS 1-4
- pages
- 717 - 720
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- The 2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS 2008)
- conference location
- Macao, China
- conference dates
- 2008-11-30 - 2008-12-03
- external identifiers
-
- wos:000268007100179
- scopus:62949148862
- ISBN
- 978-1-4244-2341-5
- language
- English
- LU publication?
- yes
- id
- 11e7ba40-c6f8-4c35-8baa-9f82cabf9935 (old id 1212783)
- date added to LUP
- 2016-04-04 10:00:43
- date last changed
- 2022-01-29 19:37:30
@inproceedings{11e7ba40-c6f8-4c35-8baa-9f82cabf9935, abstract = {{in today’s technology generations, e.g. 90 and 65 nm, the static power consumption becomes a major contributor to the total power consumption. It is therefore important to consider all abstraction levels to reduce this power. This paper focuses on the arithmetic level and shows a methodology for a substantial reduction of the static power consumption. Both the dynamic and static power consumption is evaluated for bit-parallel and bit-serial arithmetic. Simulations are done in a typical 130 nm technology. With only a minor cost in dynamic power consumption, a static power reduction up to 13 times is shown by using bit-serial arithmetic.}}, author = {{Nilsson, Peter}}, booktitle = {{2008 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS 2008), VOLS 1-4}}, isbn = {{978-1-4244-2341-5}}, language = {{eng}}, pages = {{717--720}}, publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}}, title = {{Arithmetic reduction of adder leakage in nanoscale CMOS}}, year = {{2008}}, }