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Workplace measurements of semiconductor nanowires in a small-scale producer

Hedmer, Maria LU orcid ; Isaxon, Christina LU ; Ludvigsson, Linus LU ; Nilsson, Patrik LU ; Rissler, Jenny LU ; Gudmundsson, Anders LU ; Bohgard, Mats LU ; Messing, Maria LU ; Tinnerberg, Håkan LU and Pagels, Joakim LU (2015) 2nd International Congress on Safety of Engineered Nanoparticles and Nanotechnologies (SENN)
Please use this url to cite or link to this publication:
author
; ; ; ; ; ; ; ; and
organization
publishing date
type
Contribution to conference
publication status
published
subject
conference name
2nd International Congress on Safety of Engineered Nanoparticles and Nanotechnologies (SENN)
conference dates
0001-01-02
language
English
LU publication?
yes
id
156e764d-e6ae-46bb-910d-ccb9d875f1ed (old id 5051302)
date added to LUP
2016-04-04 14:22:24
date last changed
2025-04-04 14:12:20
@misc{156e764d-e6ae-46bb-910d-ccb9d875f1ed,
  author       = {{Hedmer, Maria and Isaxon, Christina and Ludvigsson, Linus and Nilsson, Patrik and Rissler, Jenny and Gudmundsson, Anders and Bohgard, Mats and Messing, Maria and Tinnerberg, Håkan and Pagels, Joakim}},
  language     = {{eng}},
  title        = {{Workplace measurements of semiconductor nanowires in a small-scale producer}},
  year         = {{2015}},
}