AFM-based manipulation of InAs nanowires
(2008) 17th International Vacuum Congress/13th International Conference on Surface Science/Internatinal Conference on Nanoscience and Technology 100. p.052051-052051- Abstract
- A controlled method of manipulation of nanowires was found using the tip of an Atomic Force Microscope (AFM). Manipulation is done in the 'Retrace Lift' mode, where feedback is turned off for the reverse scan and the tip follows a nominal path. The effective manipulation force during the reverse scan can be changed by varying an offset in the height of the tip over the surface. Using this method, we have studied InAs nanowires on different substrates. We have also investigated interactions between wires and with gold features patterned onto the substrates.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/1586325
- author
- Conache, Gabriela LU ; Gray, Struan LU ; Bordag, M. ; Ribayrol, Aline LU ; Fröberg, Linus LU ; Samuelson, Lars LU ; Pettersson, H and Montelius, Lars LU
- organization
- publishing date
- 2008
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- Journal of Physics: Conference Series
- volume
- 100
- pages
- 052051 - 052051
- publisher
- IOP Publishing
- conference name
- 17th International Vacuum Congress/13th International Conference on Surface Science/Internatinal Conference on Nanoscience and Technology
- conference location
- Stockholm, Sweden
- conference dates
- 2007-07-02 - 2007-07-06
- external identifiers
-
- wos:000275655200147
- scopus:77954338849
- ISSN
- 1742-6596
- 1742-6588
- DOI
- 10.1088/1742-6596/100/5/052051
- language
- English
- LU publication?
- yes
- id
- 0c58260e-f98a-4d14-ba15-76e0008fb782 (old id 1586325)
- date added to LUP
- 2016-04-01 12:35:47
- date last changed
- 2025-01-30 02:38:11
@inproceedings{0c58260e-f98a-4d14-ba15-76e0008fb782, abstract = {{A controlled method of manipulation of nanowires was found using the tip of an Atomic Force Microscope (AFM). Manipulation is done in the 'Retrace Lift' mode, where feedback is turned off for the reverse scan and the tip follows a nominal path. The effective manipulation force during the reverse scan can be changed by varying an offset in the height of the tip over the surface. Using this method, we have studied InAs nanowires on different substrates. We have also investigated interactions between wires and with gold features patterned onto the substrates.}}, author = {{Conache, Gabriela and Gray, Struan and Bordag, M. and Ribayrol, Aline and Fröberg, Linus and Samuelson, Lars and Pettersson, H and Montelius, Lars}}, booktitle = {{Journal of Physics: Conference Series}}, issn = {{1742-6596}}, language = {{eng}}, pages = {{052051--052051}}, publisher = {{IOP Publishing}}, title = {{AFM-based manipulation of InAs nanowires}}, url = {{http://dx.doi.org/10.1088/1742-6596/100/5/052051}}, doi = {{10.1088/1742-6596/100/5/052051}}, volume = {{100}}, year = {{2008}}, }