Securing IEEE 1687 (IJTAG)
Åhlund, Joel LU ; Törmänen, Markus LU
and Larsson, Erik
LU
(2025)
Nordic Test Forum (NTF)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/1685db4b-01a5-4d9f-a10c-92914b1d58c4
- author
- Åhlund, Joel
LU
; Törmänen, Markus
LU
and Larsson, Erik
LU
- organization
-
- Department of Electrical and Information Technology
- LTH Profile Area: Nanoscience and Semiconductor Technology
- LTH Profile Area: AI and Digitalization
- Integrated Electronic Systems
- ELLIIT: the Linköping-Lund initiative on IT and mobile communication
- LTH School of Engineering in Helsingborg
- Electrical Engineering (M.Sc.Eng.)
- publishing date
- 2025-12-03
- type
- Contribution to conference
- publication status
- published
- subject
- conference name
- Nordic Test Forum (NTF)
- conference location
- Snekkersten, Denmark
- conference dates
- 2025-12-02 - 2025-12-03
- language
- English
- LU publication?
- yes
- id
- 1685db4b-01a5-4d9f-a10c-92914b1d58c4
- date added to LUP
- 2025-10-01 10:49:47
- date last changed
- 2025-10-09 16:34:12
@misc{1685db4b-01a5-4d9f-a10c-92914b1d58c4,
author = {{Åhlund, Joel and Törmänen, Markus and Larsson, Erik}},
language = {{eng}},
month = {{12}},
title = {{Securing IEEE 1687 (IJTAG)}},
year = {{2025}},
}